Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion
Electronic equipment in nuclear power plants and nuclear warfare is damaged by transient effects that cause high-energy pulsed radiation. There is a concern that this type of damage can even cause enormous economic losses and human casualties by paralyzing control systems. To solve this problem, thi...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-09-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/11/18/2970 |
| _version_ | 1797489062334955520 |
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| author | Minwoong Lee Namho Lee Huijeong Gwon Jongyeol Kim Younggwan Hwang Seongik Cho |
| author_facet | Minwoong Lee Namho Lee Huijeong Gwon Jongyeol Kim Younggwan Hwang Seongik Cho |
| author_sort | Minwoong Lee |
| collection | DOAJ |
| description | Electronic equipment in nuclear power plants and nuclear warfare is damaged by transient effects that cause high-energy pulsed radiation. There is a concern that this type of damage can even cause enormous economic losses and human casualties by paralyzing control systems. To solve this problem, this study proposes a complementary metal-oxide semiconductor (CMOS) logic-based, switching detection circuit that can detect pulsed radiations at a fast rate. This circuit improved response speed and power consumption by using the switching operation of digital logic compared with conventional circuits. Furthermore, radiation tolerance to total ionizing dose (TID) effects was achieved even in a cumulative radiation environment because of the use of the design using p-metal-oxide semiconductor field effect transistor (p-MOSFET). The proposed detection circuit was manufactured by a 0.18 µm CMOS bulk process for integration. Normal operation in the detection range of 2.0 × 10<sup>7</sup> rad(si)/s was verified by pulsed radiation test evaluations, and the tolerance properties to a radiation of 2 Mrad was verified based on cumulative radiation test evaluations. |
| first_indexed | 2024-03-10T00:11:10Z |
| format | Article |
| id | doaj.art-6f055e739ff2447d9b8123f307e09caf |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T00:11:10Z |
| publishDate | 2022-09-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-6f055e739ff2447d9b8123f307e09caf2023-11-23T15:59:44ZengMDPI AGElectronics2079-92922022-09-011118297010.3390/electronics11182970Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear ExplosionMinwoong Lee0Namho Lee1Huijeong Gwon2Jongyeol Kim3Younggwan Hwang4Seongik Cho5Korea Atomic Energy Research Institute, Deajeon 34057, KoreaKorea Atomic Energy Research Institute, Deajeon 34057, KoreaKorea Atomic Energy Research Institute, Deajeon 34057, KoreaKorea Atomic Energy Research Institute, Deajeon 34057, KoreaKorea Atomic Energy Research Institute, Deajeon 34057, KoreaDepartment of Electronic Engineering, Chonbuk National University, Jeonju 54896, KoreaElectronic equipment in nuclear power plants and nuclear warfare is damaged by transient effects that cause high-energy pulsed radiation. There is a concern that this type of damage can even cause enormous economic losses and human casualties by paralyzing control systems. To solve this problem, this study proposes a complementary metal-oxide semiconductor (CMOS) logic-based, switching detection circuit that can detect pulsed radiations at a fast rate. This circuit improved response speed and power consumption by using the switching operation of digital logic compared with conventional circuits. Furthermore, radiation tolerance to total ionizing dose (TID) effects was achieved even in a cumulative radiation environment because of the use of the design using p-metal-oxide semiconductor field effect transistor (p-MOSFET). The proposed detection circuit was manufactured by a 0.18 µm CMOS bulk process for integration. Normal operation in the detection range of 2.0 × 10<sup>7</sup> rad(si)/s was verified by pulsed radiation test evaluations, and the tolerance properties to a radiation of 2 Mrad was verified based on cumulative radiation test evaluations.https://www.mdpi.com/2079-9292/11/18/2970high-pulse radiationswitching-detection circuitradiation test evaluationradiation tolerancetotal ionizing dose effectselectronic equipment |
| spellingShingle | Minwoong Lee Namho Lee Huijeong Gwon Jongyeol Kim Younggwan Hwang Seongik Cho Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion Electronics high-pulse radiation switching-detection circuit radiation test evaluation radiation tolerance total ionizing dose effects electronic equipment |
| title | Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion |
| title_full | Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion |
| title_fullStr | Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion |
| title_full_unstemmed | Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion |
| title_short | Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion |
| title_sort | design of radiation tolerant high speed signal processing circuit for detecting prompt gamma rays by nuclear explosion |
| topic | high-pulse radiation switching-detection circuit radiation test evaluation radiation tolerance total ionizing dose effects electronic equipment |
| url | https://www.mdpi.com/2079-9292/11/18/2970 |
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