Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination
Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (KPFM) to study materials and interfaces with...
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| Format: | Article |
| Language: | English |
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EDP Sciences
2022-01-01
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| Series: | EPJ Photovoltaics |
| Subjects: | |
| Online Access: | https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220018/pv220018.html |
| _version_ | 1798036570220003328 |
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| author | da Lisca Mattia Connolly James P. Alvarez José Mekhazni Karim Vaissiere Nicolas Decobert Jean Kleider Jean-Paul |
| author_facet | da Lisca Mattia Connolly James P. Alvarez José Mekhazni Karim Vaissiere Nicolas Decobert Jean Kleider Jean-Paul |
| author_sort | da Lisca Mattia |
| collection | DOAJ |
| description | Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (KPFM) to study materials and interfaces with nanometer scale imaging of the surface potential in the dark and under illumination. KPFM measurements are highly sensitive to surface states and to the experimental measurement environment influencing the atomic probe operating conditions. Therefore, in order to develop a quantitative understanding of KPFM measurements, we have prepared a dedicated structured sample with alternating layers of InP:S and InP:Fe whose doping densities were determined by secondary-ion mass spectroscopy. We have performed KPFM measurements and shown that we can spatially resolve 20 nm thick InP layers, notably when performed under illumination which is well-known to reduce the surface band-bending. |
| first_indexed | 2024-04-11T21:14:49Z |
| format | Article |
| id | doaj.art-6f4d7f62a78e41888a604eadc26864b3 |
| institution | Directory Open Access Journal |
| issn | 2105-0716 |
| language | English |
| last_indexed | 2024-04-11T21:14:49Z |
| publishDate | 2022-01-01 |
| publisher | EDP Sciences |
| record_format | Article |
| series | EPJ Photovoltaics |
| spelling | doaj.art-6f4d7f62a78e41888a604eadc26864b32022-12-22T04:02:50ZengEDP SciencesEPJ Photovoltaics2105-07162022-01-01131910.1051/epjpv/2022017pv220018Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illuminationda Lisca Mattia0Connolly James P.1Alvarez José2Mekhazni Karim3Vaissiere Nicolas4Decobert Jean5Kleider Jean-Paul6Institut Photovoltaïque d'Ile de France, 30 Route Départementale 128Institut Photovoltaïque d'Ile de France, 30 Route Départementale 128Institut Photovoltaïque d'Ile de France, 30 Route Départementale 128III-V Lab, 1 Avenue Augustin FresnelIII-V Lab, 1 Avenue Augustin FresnelIII-V Lab, 1 Avenue Augustin FresnelInstitut Photovoltaïque d'Ile de France, 30 Route Départementale 128Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (KPFM) to study materials and interfaces with nanometer scale imaging of the surface potential in the dark and under illumination. KPFM measurements are highly sensitive to surface states and to the experimental measurement environment influencing the atomic probe operating conditions. Therefore, in order to develop a quantitative understanding of KPFM measurements, we have prepared a dedicated structured sample with alternating layers of InP:S and InP:Fe whose doping densities were determined by secondary-ion mass spectroscopy. We have performed KPFM measurements and shown that we can spatially resolve 20 nm thick InP layers, notably when performed under illumination which is well-known to reduce the surface band-bending.https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220018/pv220018.htmlkelvin probe force microscopyiii-v multilayer stacksurface photovoltage |
| spellingShingle | da Lisca Mattia Connolly James P. Alvarez José Mekhazni Karim Vaissiere Nicolas Decobert Jean Kleider Jean-Paul Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination EPJ Photovoltaics kelvin probe force microscopy iii-v multilayer stack surface photovoltage |
| title | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination |
| title_full | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination |
| title_fullStr | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination |
| title_full_unstemmed | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination |
| title_short | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination |
| title_sort | revealing of inp multi layer stacks from kpfm measurements in the dark and under illumination |
| topic | kelvin probe force microscopy iii-v multilayer stack surface photovoltage |
| url | https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220018/pv220018.html |
| work_keys_str_mv | AT daliscamattia revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT connollyjamesp revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT alvarezjose revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT mekhaznikarim revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT vaissierenicolas revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT decobertjean revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination AT kleiderjeanpaul revealingofinpmultilayerstacksfromkpfmmeasurementsinthedarkandunderillumination |