HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements
We present preliminary obtained with a new spectrometer based on the Johann configuration of cylindrically bent crystals, the HIDEX. The aim of this instrument is to provide detailed line shape and shift measurements of transitions originating from high intensity laser/matter interaction, especially...
Main Authors: | Galtier E., Renner O., Krouský E., Rosmej F. |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2013-11-01
|
Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/20135913002 |
Similar Items
-
NEW METHODS OF X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMAS WITH ONE-DIMENSIONAL SPATIAL-RESOLUTION
by: Renner, O, et al.
Published: (1994) -
α/β Discrimination by Hidex Liquid Scintillation Counter and Method for LSC Spectra Reconstruction
by: FENG Xiao-gui, et al.
Published: (2023-04-01) -
Challenges of x-ray spectroscopy in investigations of matter under extreme conditions
by: O. Renner, et al.
Published: (2019-03-01) -
Critical-angle transmission grating spectrometer for high-resolution soft x-ray spectroscopy on the International X-ray Observatory
by: Davis, John E., et al.
Published: (2011) -
Multilayer Mirror Based High-Resolution Solar Soft X-Ray Spectrometer
by: S. S. Panini, et al.
Published: (2021-07-01)