Development of accelerated test method for developing failure prediction technology for SoC-equipped boards and application to failure prediction
In recent years, attention has been focused on failure prediction technology for electronic devices that can ensure the stable operation of the infrastructure, by warning the failure of devices before it happens, and noticing for an early maintenance which can minimize downtime. Different from the H...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | Japanese |
| Published: |
The Japan Society of Mechanical Engineers
2024-01-01
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| Series: | Nihon Kikai Gakkai ronbunshu |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/transjsme/90/929/90_23-00108/_pdf/-char/en |