The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields
<span><p class="a">Electroluminescence (EL) intensity of the polyimide (PI) films was tested under dc high electric field by home-made experimental device. The results showed that the EL intensity of PI films increased along with the electric field. EL intensity is approximatel...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Kaunas University of Technology
2015-11-01
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| Series: | Medžiagotyra |
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| Online Access: | http://matsc.ktu.lt/index.php/MatSc/article/view/9694 |
| _version_ | 1819107312888971264 |
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| author | Jiaqi LIN Ying LIU Zhibin XIE Xiaxia HE |
| author_facet | Jiaqi LIN Ying LIU Zhibin XIE Xiaxia HE |
| author_sort | Jiaqi LIN |
| collection | DOAJ |
| description | <span><p class="a">Electroluminescence (EL) intensity of the polyimide (PI) films was tested under dc high electric field by home-made experimental device. The results showed that the EL intensity of PI films increased along with the electric field. EL intensity is approximately to background intensity when the electric-field intensity was less than 2.00 MV/cm. EL intensity increases along with increasing the electric field when electric-field intensity greater than 2.00 MV/cm. When electric-field at 2.80 MV/cm, EL intensity increasing strongly suggests that the excitation process related to hot electrons accelerated by the field approaching a critical threshold. Meanwhile, this work elaborates a method to deal with identical samples get different experimental data by using Weibull distribution method, and the concept of the reliability was presented. The nine groups of EL experimental data were analyzed, and the result showed that the lifetime of mid-value (<em>t</em> = 164.9 min). Mid-value of the breakdown field is E = 2.76 MV/cm.</p></span><p>DOI: <a href="http://dx.doi.org/10.5755/j01.ms.21.4.9694">http://dx.doi.org/10.5755/j01.ms.21.4.9694</a></p> |
| first_indexed | 2024-12-22T02:52:03Z |
| format | Article |
| id | doaj.art-6fec04fea07543b0a501e264c36b9da1 |
| institution | Directory Open Access Journal |
| issn | 1392-1320 2029-7289 |
| language | English |
| last_indexed | 2024-12-22T02:52:03Z |
| publishDate | 2015-11-01 |
| publisher | Kaunas University of Technology |
| record_format | Article |
| series | Medžiagotyra |
| spelling | doaj.art-6fec04fea07543b0a501e264c36b9da12022-12-21T18:41:21ZengKaunas University of TechnologyMedžiagotyra1392-13202029-72892015-11-0121454955310.5755/j01.ms.21.4.96946609The Study of Electroluminescence and Reliability of Polyimide Films in High DC FieldsJiaqi LINYing LIUZhibin XIEXiaxia HE<span><p class="a">Electroluminescence (EL) intensity of the polyimide (PI) films was tested under dc high electric field by home-made experimental device. The results showed that the EL intensity of PI films increased along with the electric field. EL intensity is approximately to background intensity when the electric-field intensity was less than 2.00 MV/cm. EL intensity increases along with increasing the electric field when electric-field intensity greater than 2.00 MV/cm. When electric-field at 2.80 MV/cm, EL intensity increasing strongly suggests that the excitation process related to hot electrons accelerated by the field approaching a critical threshold. Meanwhile, this work elaborates a method to deal with identical samples get different experimental data by using Weibull distribution method, and the concept of the reliability was presented. The nine groups of EL experimental data were analyzed, and the result showed that the lifetime of mid-value (<em>t</em> = 164.9 min). Mid-value of the breakdown field is E = 2.76 MV/cm.</p></span><p>DOI: <a href="http://dx.doi.org/10.5755/j01.ms.21.4.9694">http://dx.doi.org/10.5755/j01.ms.21.4.9694</a></p>http://matsc.ktu.lt/index.php/MatSc/article/view/9694PI films, electroluminescence, breakdown, reliability, Weibull distribution |
| spellingShingle | Jiaqi LIN Ying LIU Zhibin XIE Xiaxia HE The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields Medžiagotyra PI films, electroluminescence, breakdown, reliability, Weibull distribution |
| title | The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields |
| title_full | The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields |
| title_fullStr | The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields |
| title_full_unstemmed | The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields |
| title_short | The Study of Electroluminescence and Reliability of Polyimide Films in High DC Fields |
| title_sort | study of electroluminescence and reliability of polyimide films in high dc fields |
| topic | PI films, electroluminescence, breakdown, reliability, Weibull distribution |
| url | http://matsc.ktu.lt/index.php/MatSc/article/view/9694 |
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