Evolution of surface recombination property of silicon wafers during laser irradiation by differential photocarrier radiometry
Understanding the surface recombination property of semiconductor materials is beneficial for improving the performance of optoelectronic devices. In this paper, differential photocarrier radiometry (PCR) is carried out to investigate the evolution of the surface recombination velocities of silicon...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2023-07-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0157087 |