FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES
The setup with a reflective microwave H101 resonator for the non-contact measurements of the electrical parameters of compact samples (the diameter less than 5 mm) is constructed. An analytical expression for calculation of the microwave power reflection coefficient by the H101 resonator with the sa...
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Format: | Article |
Language: | English |
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Belarusian National Technical University
2015-03-01
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Series: | Pribory i Metody Izmerenij |
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Online Access: | https://pimi.bntu.by/jour/article/view/19 |
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author | N. A. Poklonski A. I. Siahlo V. T. Shnitko V. A. Merkulov O. M. Davidenia A. I. Kovalev |
author_facet | N. A. Poklonski A. I. Siahlo V. T. Shnitko V. A. Merkulov O. M. Davidenia A. I. Kovalev |
author_sort | N. A. Poklonski |
collection | DOAJ |
description | The setup with a reflective microwave H101 resonator for the non-contact measurements of the electrical parameters of compact samples (the diameter less than 5 mm) is constructed. An analytical expression for calculation of the microwave power reflection coefficient by the H101 resonator with the sample being inside the resonator with respect to the dielectric permittivity and conductivity of sample is obtained. The dependence of the microwave power reflection on the diameter of the metallic and glassy globs freely falling through the resonator is experimentally found. an> |
first_indexed | 2024-04-10T01:39:11Z |
format | Article |
id | doaj.art-714bf95e7b9e4e0090a2c36080940942 |
institution | Directory Open Access Journal |
issn | 2220-9506 2414-0473 |
language | English |
last_indexed | 2024-04-10T01:39:11Z |
publishDate | 2015-03-01 |
publisher | Belarusian National Technical University |
record_format | Article |
series | Pribory i Metody Izmerenij |
spelling | doaj.art-714bf95e7b9e4e0090a2c360809409422023-03-13T09:14:44ZengBelarusian National Technical UniversityPribory i Metody Izmerenij2220-95062414-04732015-03-0101647113FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLESN. A. Poklonski0A. I. Siahlo1V. T. Shnitko2V. A. Merkulov3O. M. Davidenia4A. I. Kovalev5Белорусский государственный университетБелорусский государственный университетБелорусский государственный университетБелорусский государственный университетБелорусский государственный университетБелорусский государственный университетThe setup with a reflective microwave H101 resonator for the non-contact measurements of the electrical parameters of compact samples (the diameter less than 5 mm) is constructed. An analytical expression for calculation of the microwave power reflection coefficient by the H101 resonator with the sample being inside the resonator with respect to the dielectric permittivity and conductivity of sample is obtained. The dependence of the microwave power reflection on the diameter of the metallic and glassy globs freely falling through the resonator is experimentally found. an>https://pimi.bntu.by/jour/article/view/19электроника свчтеория цепей свчмикроволновая техникарезонаторные системынеразрушающий контроль |
spellingShingle | N. A. Poklonski A. I. Siahlo V. T. Shnitko V. A. Merkulov O. M. Davidenia A. I. Kovalev FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES Pribory i Metody Izmerenij электроника свч теория цепей свч микроволновая техника резонаторные системы неразрушающий контроль |
title | FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES |
title_full | FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES |
title_fullStr | FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES |
title_full_unstemmed | FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES |
title_short | FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES |
title_sort | fast method of non contact microwave measurements of electrical parameters of compact samples |
topic | электроника свч теория цепей свч микроволновая техника резонаторные системы неразрушающий контроль |
url | https://pimi.bntu.by/jour/article/view/19 |
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