Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys

This study investigated the effects of annealing on the microstructure, mechanical properties, and electrical conductivity (EC) of AA4043 rods produced through the Properzi CCR process. Annealing was conducted at two temperatures (200 °C and 300 °C) for 4 h. Characterization techniques were performe...

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Main Authors: Mohammad Khoshghadam-Pireyousefan, Mousa Javidani, Alexandre Maltais, Julie Lévesque, X.-Grant Chen
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Engineering Proceedings
Subjects:
Online Access:https://www.mdpi.com/2673-4591/43/1/14
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author Mohammad Khoshghadam-Pireyousefan
Mousa Javidani
Alexandre Maltais
Julie Lévesque
X.-Grant Chen
author_facet Mohammad Khoshghadam-Pireyousefan
Mousa Javidani
Alexandre Maltais
Julie Lévesque
X.-Grant Chen
author_sort Mohammad Khoshghadam-Pireyousefan
collection DOAJ
description This study investigated the effects of annealing on the microstructure, mechanical properties, and electrical conductivity (EC) of AA4043 rods produced through the Properzi CCR process. Annealing was conducted at two temperatures (200 °C and 300 °C) for 4 h. Characterization techniques were performed on the rod samples, including optical microscopy, EBSD, microhardness, tensile tests, and EC measurements. The results showed a significant improvement in EC with decreased mechanical strength during annealing. The sample annealed at 300 °C exhibited the most favorable combination of EC (57.48% IACS), microhardness (41 HV), and ultimate tensile strength (124 MPa). Furthermore, the image analysis revealed slight alterations in the shape factors of eutectic Si particles with increasing annealing temperature. In addition, EBSD results demonstrated that the annealing promoted the recrystallization process.
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spelling doaj.art-717b6bc23a474a0ebd0b63c61d2fe44f2023-12-22T14:06:22ZengMDPI AGEngineering Proceedings2673-45912023-09-014311410.3390/engproc2023043014Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based AlloysMohammad Khoshghadam-Pireyousefan0Mousa Javidani1Alexandre Maltais2Julie Lévesque3X.-Grant Chen4Department of Applied Science, University of Québec at Chicoutimi, Saguenay, QC G7H 2B1, CanadaDepartment of Applied Science, University of Québec at Chicoutimi, Saguenay, QC G7H 2B1, CanadaArvida Research and Development Center, Rio Tinto Aluminum, Saguenay, QC G7S 4K8, CanadaQuébec Metallurgy Centre, Trois-Rivières, QC G9A 5E1, CanadaDepartment of Applied Science, University of Québec at Chicoutimi, Saguenay, QC G7H 2B1, CanadaThis study investigated the effects of annealing on the microstructure, mechanical properties, and electrical conductivity (EC) of AA4043 rods produced through the Properzi CCR process. Annealing was conducted at two temperatures (200 °C and 300 °C) for 4 h. Characterization techniques were performed on the rod samples, including optical microscopy, EBSD, microhardness, tensile tests, and EC measurements. The results showed a significant improvement in EC with decreased mechanical strength during annealing. The sample annealed at 300 °C exhibited the most favorable combination of EC (57.48% IACS), microhardness (41 HV), and ultimate tensile strength (124 MPa). Furthermore, the image analysis revealed slight alterations in the shape factors of eutectic Si particles with increasing annealing temperature. In addition, EBSD results demonstrated that the annealing promoted the recrystallization process.https://www.mdpi.com/2673-4591/43/1/14Al-Si conductor alloysannealingelectrical conductivitymechanical properties
spellingShingle Mohammad Khoshghadam-Pireyousefan
Mousa Javidani
Alexandre Maltais
Julie Lévesque
X.-Grant Chen
Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
Engineering Proceedings
Al-Si conductor alloys
annealing
electrical conductivity
mechanical properties
title Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
title_full Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
title_fullStr Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
title_full_unstemmed Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
title_short Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys
title_sort effect of annealing temperature on the microstructure mechanical properties and electrical conductivity of 4xxx series al based alloys
topic Al-Si conductor alloys
annealing
electrical conductivity
mechanical properties
url https://www.mdpi.com/2673-4591/43/1/14
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AT alexandremaltais effectofannealingtemperatureonthemicrostructuremechanicalpropertiesandelectricalconductivityof4xxxseriesalbasedalloys
AT julielevesque effectofannealingtemperatureonthemicrostructuremechanicalpropertiesandelectricalconductivityof4xxxseriesalbasedalloys
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