Theoretical and Experimental Investigations of Laser Annealing Non-Stoichiometric SiOx Films

In this work, spreading of temperature profiles and influence of a temperature on forming silicon nanoparticles in non-stoichiometric SiOx films after laser annealing is investigated. Using parabolic thermal conductivity equation, mathematical simulation of temperature profiles is realized in a non-...

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Bibliographic Details
Main Authors: O. O. Gavryliuk, O. Yu. Semchuk, B. V. Lytovchenko
Format: Article
Language:English
Published: Vasyl Stefanyk Precarpathian National University 2015-12-01
Series:Фізика і хімія твердого тіла
Online Access:http://journals.pu.if.ua/index.php/pcss/article/view/821
Description
Summary:In this work, spreading of temperature profiles and influence of a temperature on forming silicon nanoparticles in non-stoichiometric SiOx films after laser annealing is investigated. Using parabolic thermal conductivity equation, mathematical simulation of temperature profiles is realized in a non-stoichiometric SiOx film after laser annealing. It is shown that temperature 1800 K on a SiOx surface is sufficient for separating the film material on silicon dioxide and its nanoparticles. IR-investigations confirm this separating. <br />Keywords: silicon oxide, nanocrystal, laser annealing, thermal conductivity equation.
ISSN:1729-4428
2309-8589