Structural and Optical Properties of GaN Thin Films Grown on Si (111) by Pulsed Laser Deposition
In this work we present results and analysis concerning the processing and characterization of Gallium Nitride (GaN) thin films (TF) grown on Si (111) substrates by pulsed laser deposition technique (PLD), which were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), photolumin...
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol)
2019-01-01
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Series: | Materials Research |
Subjects: | |
Online Access: | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392019000200206&tlng=en |