Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction
Electrical aging in lead zirconate titanate (PbZr<sub>x</sub>Ti<sub>1−x</sub>O<sub>3</sub>) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study,...
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2021-08-01
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| Online Access: | https://www.mdpi.com/1996-1944/14/16/4500 |
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| author | Kien Nguyen Ewen Bellec Edoardo Zatterin Gwenael Le Rhun Patrice Gergaud Nicolas Vaxelaire |
| author_facet | Kien Nguyen Ewen Bellec Edoardo Zatterin Gwenael Le Rhun Patrice Gergaud Nicolas Vaxelaire |
| author_sort | Kien Nguyen |
| collection | DOAJ |
| description | Electrical aging in lead zirconate titanate (PbZr<sub>x</sub>Ti<sub>1−x</sub>O<sub>3</sub>) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study, we have used synchrotron radiation to evaluate the behavior of ferroelectric domains by X-ray diffraction (XRD). The sample was loaded with an AC triangular bias waveform between ±10 V with a number of cycle varying from one up to 10<sup>8</sup>. At each step of the aging procedure, XRD spectra had been collected in situ during the application of an electric field on a capacitor. The fine analysis of the (200) pseudo-cubic peak structure allows to separate the evolution of the volume of a/c tetragonal and rhombohedral domains along the electrical biasing. Throughout the aging, both intrinsic and extrinsic responses of tetra and rhombohedral domains are altered, the behavior depending on the observed phase. This methodology opens up new perspectives in the comprehension of the aging effect in ferroelectric thin film. |
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| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-10T08:39:08Z |
| publishDate | 2021-08-01 |
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| spelling | doaj.art-722cc60c9e2640e4b05803394813335d2023-11-22T08:28:26ZengMDPI AGMaterials1996-19442021-08-011416450010.3390/ma14164500Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray DiffractionKien Nguyen0Ewen Bellec1Edoardo Zatterin2Gwenael Le Rhun3Patrice Gergaud4Nicolas Vaxelaire5University Grenoble Alpes, CEA, Leti, F-38000 Grenoble, FranceESRF, The European Synchrotron, 71 Avenue des Martyrs, CS40220, CEDEX 9, 38043 Grenoble, FranceESRF, The European Synchrotron, 71 Avenue des Martyrs, CS40220, CEDEX 9, 38043 Grenoble, FranceUniversity Grenoble Alpes, CEA, Leti, F-38000 Grenoble, FranceUniversity Grenoble Alpes, CEA, Leti, F-38000 Grenoble, FranceUniversity Grenoble Alpes, CEA, Leti, F-38000 Grenoble, FranceElectrical aging in lead zirconate titanate (PbZr<sub>x</sub>Ti<sub>1−x</sub>O<sub>3</sub>) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study, we have used synchrotron radiation to evaluate the behavior of ferroelectric domains by X-ray diffraction (XRD). The sample was loaded with an AC triangular bias waveform between ±10 V with a number of cycle varying from one up to 10<sup>8</sup>. At each step of the aging procedure, XRD spectra had been collected in situ during the application of an electric field on a capacitor. The fine analysis of the (200) pseudo-cubic peak structure allows to separate the evolution of the volume of a/c tetragonal and rhombohedral domains along the electrical biasing. Throughout the aging, both intrinsic and extrinsic responses of tetra and rhombohedral domains are altered, the behavior depending on the observed phase. This methodology opens up new perspectives in the comprehension of the aging effect in ferroelectric thin film.https://www.mdpi.com/1996-1944/14/16/4500in situ biasing X-ray diffractionPZT thin filmMPBferroelectric domainseffective piezoelectric coefficientelectrical aging |
| spellingShingle | Kien Nguyen Ewen Bellec Edoardo Zatterin Gwenael Le Rhun Patrice Gergaud Nicolas Vaxelaire Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction Materials in situ biasing X-ray diffraction PZT thin film MPB ferroelectric domains effective piezoelectric coefficient electrical aging |
| title | Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction |
| title_full | Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction |
| title_fullStr | Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction |
| title_full_unstemmed | Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction |
| title_short | Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction |
| title_sort | structural insights of electrical aging in pzt thin films as revealed by in situ biasing x ray diffraction |
| topic | in situ biasing X-ray diffraction PZT thin film MPB ferroelectric domains effective piezoelectric coefficient electrical aging |
| url | https://www.mdpi.com/1996-1944/14/16/4500 |
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