Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Electrical aging in lead zirconate titanate (PbZr<sub>x</sub>Ti<sub>1−x</sub>O<sub>3</sub>) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study,...

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Bibliographic Details
Main Authors: Kien Nguyen, Ewen Bellec, Edoardo Zatterin, Gwenael Le Rhun, Patrice Gergaud, Nicolas Vaxelaire
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Materials
Subjects:
in situ biasing X-ray diffraction
PZT thin film
MPB
ferroelectric domains
effective piezoelectric coefficient
electrical aging
Online Access:https://www.mdpi.com/1996-1944/14/16/4500

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