Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness

In this work, the current-voltage and photoelectric spectral characteristics of double heterodiodes por-Si/Si-p/Si-n and a reference diode with a p–n junction at room temperature are analyzed and compared with data on the thickness of porous silicon layers and photoluminescence spectra for the synth...

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Main Authors: Yan Dmitriy, Galkin Nikolay, Galkin Konstantin, Chernev Igor
Format: Article
Language:English
Published: Peter the Great St.Petersburg Polytechnic University 2022-10-01
Series:St. Petersburg Polytechnical University Journal: Physics and Mathematics
Subjects:
Online Access:https://physmath.spbstu.ru/article/2022.58.24/
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author Yan Dmitriy
Galkin Nikolay
Galkin Konstantin
Chernev Igor
author_facet Yan Dmitriy
Galkin Nikolay
Galkin Konstantin
Chernev Igor
author_sort Yan Dmitriy
collection DOAJ
description In this work, the current-voltage and photoelectric spectral characteristics of double heterodiodes por-Si/Si-p/Si-n and a reference diode with a p–n junction at room temperature are analyzed and compared with data on the thickness of porous silicon layers and photoluminescence spectra for the synthesized heterostructures. It is shown that photospectral sensitivity in the region of 400–800 nm is exhibited by diodes with a single-layer structure of porous silicon whose thickness does not exceed 2 µm. In this case, the amplitude of the spectral photoresponse decreases with a decrease in the thickness of the porous layer. As for diodes with a two-layer structure of porous silicon (ordinary porous and tree-like porous) and thicknesses from 4.5 µm to 17.4 µm, currents do not flow due to rapid oxidation of such structures. A band energy diagram of a double heterodiode with a layer of porous silicon is proposed based on the experimental data.
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spelling doaj.art-72c9d71313394235aaa4accacfe643ee2022-12-22T02:43:00ZengPeter the Great St.Petersburg Polytechnic UniversitySt. Petersburg Polytechnical University Journal: Physics and Mathematics2405-72232022-10-01153.110.18721/JPM.153.12420714726Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thicknessYan Dmitriy0https://orcid.org/0000-0002-0602-9301Galkin Nikolay1https://orcid.org/0000-0003-4127-2988Galkin Konstantin2https://orcid.org/0000-0001-5386-1013Chernev Igor3https://orcid.org/0000-0002-8726-9832Far Eastern State Transport UniversityInstitute of Automation and Control Processes FEB RASInstitute of Automation and Control Processes Far Eastern Branch of the Russian Academy of SciencesInstitute of Automation and Control Processes Far Eastern Branch of the Russian Academy of SciencesIn this work, the current-voltage and photoelectric spectral characteristics of double heterodiodes por-Si/Si-p/Si-n and a reference diode with a p–n junction at room temperature are analyzed and compared with data on the thickness of porous silicon layers and photoluminescence spectra for the synthesized heterostructures. It is shown that photospectral sensitivity in the region of 400–800 nm is exhibited by diodes with a single-layer structure of porous silicon whose thickness does not exceed 2 µm. In this case, the amplitude of the spectral photoresponse decreases with a decrease in the thickness of the porous layer. As for diodes with a two-layer structure of porous silicon (ordinary porous and tree-like porous) and thicknesses from 4.5 µm to 17.4 µm, currents do not flow due to rapid oxidation of such structures. A band energy diagram of a double heterodiode with a layer of porous silicon is proposed based on the experimental data.https://physmath.spbstu.ru/article/2022.58.24/siliconbuilt-in p–n junctionilluminationporous layer thicknesstree-like porous structuredouble heterodiodecurrent blockingphotoresponse spectradiode band diagram
spellingShingle Yan Dmitriy
Galkin Nikolay
Galkin Konstantin
Chernev Igor
Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
St. Petersburg Polytechnical University Journal: Physics and Mathematics
silicon
built-in p–n junction
illumination
porous layer thickness
tree-like porous structure
double heterodiode
current blocking
photoresponse spectra
diode band diagram
title Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
title_full Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
title_fullStr Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
title_full_unstemmed Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
title_short Сurrent-voltage characteristics and photoelectric properties of por-Si/Si-p/Si-n diodes with different porous layer thickness
title_sort сurrent voltage characteristics and photoelectric properties of por si si p si n diodes with different porous layer thickness
topic silicon
built-in p–n junction
illumination
porous layer thickness
tree-like porous structure
double heterodiode
current blocking
photoresponse spectra
diode band diagram
url https://physmath.spbstu.ru/article/2022.58.24/
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AT galkinnikolay surrentvoltagecharacteristicsandphotoelectricpropertiesofporsisipsindiodeswithdifferentporouslayerthickness
AT galkinkonstantin surrentvoltagecharacteristicsandphotoelectricpropertiesofporsisipsindiodeswithdifferentporouslayerthickness
AT chernevigor surrentvoltagecharacteristicsandphotoelectricpropertiesofporsisipsindiodeswithdifferentporouslayerthickness