An analytical approach to engineer multistability in the oscillatory response of a pulse-driven ReRAM

An analytical approach to engineer multistability in the oscillatory response of a pulse-driven ReRAM

Abstract A nonlinear system, exhibiting a unique asymptotic behaviour, while being continuously subject to a stimulus from a certain class, is said to suffer from fading memory. This interesting phenomenon was first uncovered in a non-volatile tantalum oxide-based memristor from Hewlett Packard Labs...

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Bibliographic Details
Main Authors: Alon Ascoli, Nicolas Schmitt, Ioannis Messaris, Ahmet Samil Demirkol, John Paul Strachan, Ronald Tetzlaff, Leon Chua
Format: Article
Language:English
Published: Nature Portfolio 2024-03-01
Series:Scientific Reports
Subjects:
ReRAM
Nonvolatility
Fading memory
Local fading memory
Multistability
Online Access:https://doi.org/10.1038/s41598-024-55255-7

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