Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry

Secondary ion mass spectrometry (SIMS) is a powerful technique for in situ triple oxygen isotope measurements that has been used for more than 30 years. Since pioneering works performed on small-radius ion microprobes in the mid-80s, tremendous progress has been made in terms of analytical precision...

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Main Authors: Nordine Bouden, Johan Villeneuve, Yves Marrocchi, Etienne Deloule, Evelyn Füri, Andrey Gurenko, Laurette Piani, Emilie Thomassot, Paula Peres, Firmino Fernandes
Format: Article
Language:English
Published: Frontiers Media S.A. 2021-03-01
Series:Frontiers in Earth Science
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/feart.2020.601169/full
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author Nordine Bouden
Johan Villeneuve
Yves Marrocchi
Etienne Deloule
Evelyn Füri
Andrey Gurenko
Laurette Piani
Emilie Thomassot
Paula Peres
Firmino Fernandes
author_facet Nordine Bouden
Johan Villeneuve
Yves Marrocchi
Etienne Deloule
Evelyn Füri
Andrey Gurenko
Laurette Piani
Emilie Thomassot
Paula Peres
Firmino Fernandes
author_sort Nordine Bouden
collection DOAJ
description Secondary ion mass spectrometry (SIMS) is a powerful technique for in situ triple oxygen isotope measurements that has been used for more than 30 years. Since pioneering works performed on small-radius ion microprobes in the mid-80s, tremendous progress has been made in terms of analytical precision, spatial resolution and analysis duration. In this respect, the emergence in the mid-90s of the large-radius ion microprobe equipped with a multi-collector system (MC-SIMS) was a game changer. Further developments achieved on CAMECA MC-SIMS since then (e.g., stability of the electronics, enhanced transmission of secondary ions, automatic centering of the secondary ion beam, enhanced control of the magnetic field, 1012Ω resistor for the Faraday cup amplifiers) allow nowadays to routinely measure oxygen isotopic ratios (18O/16O and 17O/16O) in various matrices with a precision (internal error and reproducibility) better than 0.5‰ (2σ), a spatial resolution smaller than 10 µm and in a few minutes per analysis. This paper focuses on the application of the MC-SIMS technique to the in situ monitoring of mass-independent triple oxygen isotope variations.
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spelling doaj.art-72f1da12037949d791659c579d6c4e8f2022-12-21T20:33:29ZengFrontiers Media S.A.Frontiers in Earth Science2296-64632021-03-01810.3389/feart.2020.601169601169Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass SpectrometryNordine Bouden0Johan Villeneuve1Yves Marrocchi2Etienne Deloule3Evelyn Füri4Andrey Gurenko5Laurette Piani6Emilie Thomassot7Paula Peres8Firmino Fernandes9Université de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceUniversité de Lorraine, CNRS, CRPG, Nancy, FranceCAMECA-AMETEK, Gennevilliers, FranceCAMECA-AMETEK, Gennevilliers, FranceSecondary ion mass spectrometry (SIMS) is a powerful technique for in situ triple oxygen isotope measurements that has been used for more than 30 years. Since pioneering works performed on small-radius ion microprobes in the mid-80s, tremendous progress has been made in terms of analytical precision, spatial resolution and analysis duration. In this respect, the emergence in the mid-90s of the large-radius ion microprobe equipped with a multi-collector system (MC-SIMS) was a game changer. Further developments achieved on CAMECA MC-SIMS since then (e.g., stability of the electronics, enhanced transmission of secondary ions, automatic centering of the secondary ion beam, enhanced control of the magnetic field, 1012Ω resistor for the Faraday cup amplifiers) allow nowadays to routinely measure oxygen isotopic ratios (18O/16O and 17O/16O) in various matrices with a precision (internal error and reproducibility) better than 0.5‰ (2σ), a spatial resolution smaller than 10 µm and in a few minutes per analysis. This paper focuses on the application of the MC-SIMS technique to the in situ monitoring of mass-independent triple oxygen isotope variations.https://www.frontiersin.org/articles/10.3389/feart.2020.601169/fullMC-SIMStriple oxygen isotopesion microprobe1012Ω resistor preamplifierCAMECA
spellingShingle Nordine Bouden
Johan Villeneuve
Yves Marrocchi
Etienne Deloule
Evelyn Füri
Andrey Gurenko
Laurette Piani
Emilie Thomassot
Paula Peres
Firmino Fernandes
Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
Frontiers in Earth Science
MC-SIMS
triple oxygen isotopes
ion microprobe
1012Ω resistor preamplifier
CAMECA
title Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
title_full Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
title_fullStr Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
title_full_unstemmed Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
title_short Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry
title_sort triple oxygen isotope measurements by multi collector secondary ion mass spectrometry
topic MC-SIMS
triple oxygen isotopes
ion microprobe
1012Ω resistor preamplifier
CAMECA
url https://www.frontiersin.org/articles/10.3389/feart.2020.601169/full
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