Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method

Calibration and correction methods for the Vector Network Analyzer (VNA) are based on the fundamental assumption of the constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calib...

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Main Author: J. Vancl
Format: Article
Language:English
Published: CTU Central Library 2007-01-01
Series:Acta Polytechnica
Subjects:
Online Access:https://ojs.cvut.cz/ojs/index.php/ap/article/view/988
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author J. Vancl
author_facet J. Vancl
author_sort J. Vancl
collection DOAJ
description Calibration and correction methods for the Vector Network Analyzer (VNA) are based on the fundamental assumption of the constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error model is affected especially by variations in the manufacturing process and also by the reproducibility of an assembly. In this paper, we propose error minimization by selecting the best combination of available calibration standards based on time domain reflection (TDR) measurement, which can also be obtained by the fourier transformation from the measured S-parameters. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on an FR4 laminate substrate which achieves the essential reduction of the measurement error in the frequency range up to 15 GHz.
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spelling doaj.art-73208e40db5843e1a73f5417c13931952022-12-22T02:49:57ZengCTU Central LibraryActa Polytechnica1210-27091805-23632007-01-01474-5988Improved Evaluation of Planar Calibration Standards Using the TDR Preselection MethodJ. VanclCalibration and correction methods for the Vector Network Analyzer (VNA) are based on the fundamental assumption of the constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error model is affected especially by variations in the manufacturing process and also by the reproducibility of an assembly. In this paper, we propose error minimization by selecting the best combination of available calibration standards based on time domain reflection (TDR) measurement, which can also be obtained by the fourier transformation from the measured S-parameters. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on an FR4 laminate substrate which achieves the essential reduction of the measurement error in the frequency range up to 15 GHz.https://ojs.cvut.cz/ojs/index.php/ap/article/view/988Calibration standardsequivalent circuitserror correctionscattering parametersvector network analyzer
spellingShingle J. Vancl
Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
Acta Polytechnica
Calibration standards
equivalent circuits
error correction
scattering parameters
vector network analyzer
title Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
title_full Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
title_fullStr Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
title_full_unstemmed Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
title_short Improved Evaluation of Planar Calibration Standards Using the TDR Preselection Method
title_sort improved evaluation of planar calibration standards using the tdr preselection method
topic Calibration standards
equivalent circuits
error correction
scattering parameters
vector network analyzer
url https://ojs.cvut.cz/ojs/index.php/ap/article/view/988
work_keys_str_mv AT jvancl improvedevaluationofplanarcalibrationstandardsusingthetdrpreselectionmethod