Occurrence of Associated Elements in a Copper Mine by EDX-SEM
BACKGROUND Associated elements in copper deposits are of high economic value. However, they are difficult to locate and utilize because of their fine (micrometer to nanometer) size. OBJECTIVES To develop a method for determining the occurrence of associated elements in copper deposits. METHODS Backs...
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| Format: | Article |
| Language: | English |
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Science Press, PR China
2021-09-01
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| Series: | Yankuang ceshi |
| Subjects: | |
| Online Access: | http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.202012240172 |
| _version_ | 1797953879559634944 |
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| author | WANG Guan DAI Jie WANG Kun-yang YANG Yin HU Zhi-zhong |
| author_facet | WANG Guan DAI Jie WANG Kun-yang YANG Yin HU Zhi-zhong |
| author_sort | WANG Guan |
| collection | DOAJ |
| description | BACKGROUND Associated elements in copper deposits are of high economic value. However, they are difficult to locate and utilize because of their fine (micrometer to nanometer) size. OBJECTIVES To develop a method for determining the occurrence of associated elements in copper deposits. METHODS Backscatter image, secondary electron image, X-ray spectrum point, line and mapping analysis technology were used to determine the mineral phases, morphological characteristics, occurrence, qualitative/quantitative and distribution laws of the associated elements of the copper deposit. The acceleration voltage of the scanning electron microscope was 20kV, the emission current was 10μA, and the energy spectrum dwelling time was 100s. RESULTS The key technologies in the sample pretreatment and analysis were discussed in detail to form a set of effective analyses of copper deposits. The energy spectrum-scanning electron microscope (EDX-SEM) microanalysis method of associated elements was established. Gold, silver, cobalt, bismuth, and selenium were all distributed in other minerals in the form of independent minerals or isomorphic substitution. CONCLUSIONS Through the study of the occurrence of the associated elements, a micro basis for the identification of mineral industrial value, mine resource evaluation, and the recovery and utilization of associated elements has been established, and provides technical support for mining, beneficiation and smelting formulation. |
| first_indexed | 2024-04-10T23:10:08Z |
| format | Article |
| id | doaj.art-7337ae3b5a95490db1bb20aba2860b64 |
| institution | Directory Open Access Journal |
| issn | 0254-5357 |
| language | English |
| last_indexed | 2024-04-10T23:10:08Z |
| publishDate | 2021-09-01 |
| publisher | Science Press, PR China |
| record_format | Article |
| series | Yankuang ceshi |
| spelling | doaj.art-7337ae3b5a95490db1bb20aba2860b642023-01-13T06:23:51ZengScience Press, PR ChinaYankuang ceshi0254-53572021-09-0140565966910.15898/j.cnki.11-2131/td.202012240172yk202012240172Occurrence of Associated Elements in a Copper Mine by EDX-SEMWANG Guan0DAI Jie1WANG Kun-yang2YANG Yin3HU Zhi-zhong4Chengdu Centre of Geological Survey, China Geological Survey, Chengdu 610081, ChinaChengdu Centre of Geological Survey, China Geological Survey, Chengdu 610081, ChinaChengdu Centre of Geological Survey, China Geological Survey, Chengdu 610081, ChinaChengdu Centre of Geological Survey, China Geological Survey, Chengdu 610081, ChinaChengdu Centre of Geological Survey, China Geological Survey, Chengdu 610081, ChinaBACKGROUND Associated elements in copper deposits are of high economic value. However, they are difficult to locate and utilize because of their fine (micrometer to nanometer) size. OBJECTIVES To develop a method for determining the occurrence of associated elements in copper deposits. METHODS Backscatter image, secondary electron image, X-ray spectrum point, line and mapping analysis technology were used to determine the mineral phases, morphological characteristics, occurrence, qualitative/quantitative and distribution laws of the associated elements of the copper deposit. The acceleration voltage of the scanning electron microscope was 20kV, the emission current was 10μA, and the energy spectrum dwelling time was 100s. RESULTS The key technologies in the sample pretreatment and analysis were discussed in detail to form a set of effective analyses of copper deposits. The energy spectrum-scanning electron microscope (EDX-SEM) microanalysis method of associated elements was established. Gold, silver, cobalt, bismuth, and selenium were all distributed in other minerals in the form of independent minerals or isomorphic substitution. CONCLUSIONS Through the study of the occurrence of the associated elements, a micro basis for the identification of mineral industrial value, mine resource evaluation, and the recovery and utilization of associated elements has been established, and provides technical support for mining, beneficiation and smelting formulation.http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.202012240172edx-semcopper depositassociated elementsoccurrenceisomorphism |
| spellingShingle | WANG Guan DAI Jie WANG Kun-yang YANG Yin HU Zhi-zhong Occurrence of Associated Elements in a Copper Mine by EDX-SEM Yankuang ceshi edx-sem copper deposit associated elements occurrence isomorphism |
| title | Occurrence of Associated Elements in a Copper Mine by EDX-SEM |
| title_full | Occurrence of Associated Elements in a Copper Mine by EDX-SEM |
| title_fullStr | Occurrence of Associated Elements in a Copper Mine by EDX-SEM |
| title_full_unstemmed | Occurrence of Associated Elements in a Copper Mine by EDX-SEM |
| title_short | Occurrence of Associated Elements in a Copper Mine by EDX-SEM |
| title_sort | occurrence of associated elements in a copper mine by edx sem |
| topic | edx-sem copper deposit associated elements occurrence isomorphism |
| url | http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.202012240172 |
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