Nonlinear dielectric response in ferroelectric thin films

Nonlinear dielectric response in ferroelectric thin films

Electrical permittivity dependence on electric external bias field was investigated in PZT thin films. The results revealed the existence of two mechanisms contributing to the electrical permittivity. The first one was related to the domain reorientation, which was responsible for a strong no linear...

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Bibliographic Details
Main Authors:	Lente, M. H., Bacichetti, A. L., Mendes, R. G., Eiras, J. A.
Format:	Article
Language:	English
Published:	Elsevier 2004-08-01
Series:	Boletín de la Sociedad Española de Cerámica y Vidrio
Subjects:	Thin films PZT polarization switching domain wall electrical permittivity Lámina delgada cambio de polarización paredes de dominio permitividad eléctrica
Online Access:	http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/440/459

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