Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy
The bonding structure is affected by environmental loads during use, causing internal stress in the adhesive layer, which leads to the debonding and expansion of the bonding layer. Therefore, it is important to accurately measure the stress distribution of the bonding layer to assess the life of the...
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MDPI AG
2022-12-01
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| Series: | Photonics |
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| Online Access: | https://www.mdpi.com/2304-6732/9/12/929 |
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| author | Yi-Fan Zhong Jiao-Jiao Ren Li-Juan Li Ji-Yang Zhang Dan-Dan Zhang Jian Gu Jun-Wen Xue Qi Chen |
| author_facet | Yi-Fan Zhong Jiao-Jiao Ren Li-Juan Li Ji-Yang Zhang Dan-Dan Zhang Jian Gu Jun-Wen Xue Qi Chen |
| author_sort | Yi-Fan Zhong |
| collection | DOAJ |
| description | The bonding structure is affected by environmental loads during use, causing internal stress in the adhesive layer, which leads to the debonding and expansion of the bonding layer. Therefore, it is important to accurately measure the stress distribution of the bonding layer to assess the life of the bonding structure. In this study, based on the transmission and reflection terahertz time-domain spectroscopy (THz-TDS) technique, the stress optical coefficients of a silicone adhesive were measured, and the calculation models of the transmission and reflection stress optical coefficients were derived. In the reflection calculation model, the caliper THz thickness measurement method was proposed to compensate for the thickness change of the silicone adhesive, under tensile stress. Under the transmission THz-TDS stress optical coefficient calculation model, the stress optical coefficient <i>C</i> of the silicone adhesive is 0.1142 ± 0.0057 MPa<sup>−1</sup>, and the stress optical coefficient <i>C</i> of the reflective system is 0.1135 ± 0.0051 MPa<sup>−1</sup>. The test results show that the reflective THz-TDS can also be used to measure the optical stress coefficient of the material, which compensates for the shortcomings of the traditional transmission measurement method, and lays a foundation for the characterization of the internal stress of the adhesive layer of the adhesive structure. |
| first_indexed | 2024-03-09T15:57:28Z |
| format | Article |
| id | doaj.art-744fefd5d5094903a20fdb2487b47df4 |
| institution | Directory Open Access Journal |
| issn | 2304-6732 |
| language | English |
| last_indexed | 2024-03-09T15:57:28Z |
| publishDate | 2022-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Photonics |
| spelling | doaj.art-744fefd5d5094903a20fdb2487b47df42023-11-24T17:24:59ZengMDPI AGPhotonics2304-67322022-12-0191292910.3390/photonics9120929Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain SpectroscopyYi-Fan Zhong0Jiao-Jiao Ren1Li-Juan Li2Ji-Yang Zhang3Dan-Dan Zhang4Jian Gu5Jun-Wen Xue6Qi Chen7School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130000, ChinaSchool of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130000, ChinaSchool of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130000, ChinaZhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, ChinaSchool of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130000, ChinaSchool of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130000, ChinaZhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, ChinaZhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, ChinaThe bonding structure is affected by environmental loads during use, causing internal stress in the adhesive layer, which leads to the debonding and expansion of the bonding layer. Therefore, it is important to accurately measure the stress distribution of the bonding layer to assess the life of the bonding structure. In this study, based on the transmission and reflection terahertz time-domain spectroscopy (THz-TDS) technique, the stress optical coefficients of a silicone adhesive were measured, and the calculation models of the transmission and reflection stress optical coefficients were derived. In the reflection calculation model, the caliper THz thickness measurement method was proposed to compensate for the thickness change of the silicone adhesive, under tensile stress. Under the transmission THz-TDS stress optical coefficient calculation model, the stress optical coefficient <i>C</i> of the silicone adhesive is 0.1142 ± 0.0057 MPa<sup>−1</sup>, and the stress optical coefficient <i>C</i> of the reflective system is 0.1135 ± 0.0051 MPa<sup>−1</sup>. The test results show that the reflective THz-TDS can also be used to measure the optical stress coefficient of the material, which compensates for the shortcomings of the traditional transmission measurement method, and lays a foundation for the characterization of the internal stress of the adhesive layer of the adhesive structure.https://www.mdpi.com/2304-6732/9/12/929terahertz time-domain spectroscopystress optical coefficientssilicone adhesivenon-destructive testingphotoelasticity |
| spellingShingle | Yi-Fan Zhong Jiao-Jiao Ren Li-Juan Li Ji-Yang Zhang Dan-Dan Zhang Jian Gu Jun-Wen Xue Qi Chen Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy Photonics terahertz time-domain spectroscopy stress optical coefficients silicone adhesive non-destructive testing photoelasticity |
| title | Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy |
| title_full | Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy |
| title_fullStr | Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy |
| title_full_unstemmed | Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy |
| title_short | Measurement of Stress Optical Coefficient for Silicone Adhesive Based on Terahertz Time Domain Spectroscopy |
| title_sort | measurement of stress optical coefficient for silicone adhesive based on terahertz time domain spectroscopy |
| topic | terahertz time-domain spectroscopy stress optical coefficients silicone adhesive non-destructive testing photoelasticity |
| url | https://www.mdpi.com/2304-6732/9/12/929 |
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