APA (7th ed.) Citation

Lee, J., & Byun, Y. (2020). Instrumented Cone Penetrometer for Dense Layer Characterization. MDPI AG.

Chicago Style (17th ed.) Citation

Lee, Jong-Sub, and Yong-Hoon Byun. Instrumented Cone Penetrometer for Dense Layer Characterization. MDPI AG, 2020.

MLA (9th ed.) Citation

Lee, Jong-Sub, and Yong-Hoon Byun. Instrumented Cone Penetrometer for Dense Layer Characterization. MDPI AG, 2020.

Warning: These citations may not always be 100% accurate.