Instrumented Cone Penetrometer for Dense Layer Characterization

Instrumented Cone Penetrometer for Dense Layer Characterization

Subsurface characterization is essential for a successful infrastructure design and construction. This paper demonstrates the use of an instrumented cone penetrometer (ICP) for a dense layer characterization at two sites. The ICP consists of a cone tip and rods equipped with an accelerometer and fou...

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Bibliographic Details
Main Authors: Jong-Sub Lee, Yong-Hoon Byun
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Sensors
Subjects:
cone penetrometer
dense layer
dynamic response
in situ test
subsurface characterization
Online Access:https://www.mdpi.com/1424-8220/20/20/5782

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