Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy

Near Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algori...

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Bibliographic Details
Main Authors: Sylvio Barbon Junior, Saulo Martielo Mastelini, Ana Paula A.C. Barbon, Douglas Fernandes Barbin, Rosalba Calvini, Jessica Fernandes Lopes, Alessandro Ulrici
Format: Article
Language:English
Published: Elsevier 2020-06-01
Series:Information Processing in Agriculture
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Online Access:http://www.sciencedirect.com/science/article/pii/S2214317318304554
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Summary:Near Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algorithms has been evaluated as an effective strategy to improve prediction performances of NIR data from wheat flour samples. Three different Multi-target approaches have been tested: Multi-target Regressor Stacking (MTRS), Ensemble of Regressor Chains (ERC) and Deep Structure for Tracking Asynchronous Regressor Stack (DSTARS). Each one of these techniques has been tested with different regression methods: Support Vector Machine (SVM), Random Forest (RF) and Linear Regression (LR), on a dataset composed of NIR spectra of bread wheat flours for the prediction of quality-related parameters. By combining all MT techniques and predictors, we obtained an improvement up to 7% in predictive performance, compared with the corresponding Single-target (ST) approaches. The results support the potential advantage of MT techniques over ST techniques for analysing NIR spectra.
ISSN:2214-3173