Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy

Near Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algori...

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Main Authors: Sylvio Barbon Junior, Saulo Martielo Mastelini, Ana Paula A.C. Barbon, Douglas Fernandes Barbin, Rosalba Calvini, Jessica Fernandes Lopes, Alessandro Ulrici
Format: Article
Language:English
Published: Elsevier 2020-06-01
Series:Information Processing in Agriculture
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2214317318304554
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author Sylvio Barbon Junior
Saulo Martielo Mastelini
Ana Paula A.C. Barbon
Douglas Fernandes Barbin
Rosalba Calvini
Jessica Fernandes Lopes
Alessandro Ulrici
author_facet Sylvio Barbon Junior
Saulo Martielo Mastelini
Ana Paula A.C. Barbon
Douglas Fernandes Barbin
Rosalba Calvini
Jessica Fernandes Lopes
Alessandro Ulrici
author_sort Sylvio Barbon Junior
collection DOAJ
description Near Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algorithms has been evaluated as an effective strategy to improve prediction performances of NIR data from wheat flour samples. Three different Multi-target approaches have been tested: Multi-target Regressor Stacking (MTRS), Ensemble of Regressor Chains (ERC) and Deep Structure for Tracking Asynchronous Regressor Stack (DSTARS). Each one of these techniques has been tested with different regression methods: Support Vector Machine (SVM), Random Forest (RF) and Linear Regression (LR), on a dataset composed of NIR spectra of bread wheat flours for the prediction of quality-related parameters. By combining all MT techniques and predictors, we obtained an improvement up to 7% in predictive performance, compared with the corresponding Single-target (ST) approaches. The results support the potential advantage of MT techniques over ST techniques for analysing NIR spectra.
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spelling doaj.art-764cc66afda64805a95677d6ec992d112023-08-02T01:46:53ZengElsevierInformation Processing in Agriculture2214-31732020-06-0172342354Multi-target prediction of wheat flour quality parameters with near infrared spectroscopySylvio Barbon Junior0Saulo Martielo Mastelini1Ana Paula A.C. Barbon2Douglas Fernandes Barbin3Rosalba Calvini4Jessica Fernandes Lopes5Alessandro Ulrici6Computer Science Department, Londrina State University (UEL), Londrina 86057-970, Brazil; Corresponding author.Computer Science Department, Londrina State University (UEL), Londrina 86057-970, BrazilAnimal Science Department, Londrina State University (UEL), Londrina 86057-970, BrazilDepartment of Food Engineering, Campinas State University (UNICAMP), Campinas 13083-862, BrazilDepartment of Life Science, University of Modena and Reggio Emilia (UNIMORE), 42122 Reggio Emilia, ItalyComputer Science Department, Londrina State University (UEL), Londrina 86057-970, BrazilDepartment of Life Science, University of Modena and Reggio Emilia (UNIMORE), 42122 Reggio Emilia, ItalyNear Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algorithms has been evaluated as an effective strategy to improve prediction performances of NIR data from wheat flour samples. Three different Multi-target approaches have been tested: Multi-target Regressor Stacking (MTRS), Ensemble of Regressor Chains (ERC) and Deep Structure for Tracking Asynchronous Regressor Stack (DSTARS). Each one of these techniques has been tested with different regression methods: Support Vector Machine (SVM), Random Forest (RF) and Linear Regression (LR), on a dataset composed of NIR spectra of bread wheat flours for the prediction of quality-related parameters. By combining all MT techniques and predictors, we obtained an improvement up to 7% in predictive performance, compared with the corresponding Single-target (ST) approaches. The results support the potential advantage of MT techniques over ST techniques for analysing NIR spectra.http://www.sciencedirect.com/science/article/pii/S2214317318304554Random forestSupport Vector MachineNear-infrared spectroscopyMachine learningMTRSDSTARS
spellingShingle Sylvio Barbon Junior
Saulo Martielo Mastelini
Ana Paula A.C. Barbon
Douglas Fernandes Barbin
Rosalba Calvini
Jessica Fernandes Lopes
Alessandro Ulrici
Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
Information Processing in Agriculture
Random forest
Support Vector Machine
Near-infrared spectroscopy
Machine learning
MTRS
DSTARS
title Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
title_full Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
title_fullStr Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
title_full_unstemmed Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
title_short Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy
title_sort multi target prediction of wheat flour quality parameters with near infrared spectroscopy
topic Random forest
Support Vector Machine
Near-infrared spectroscopy
Machine learning
MTRS
DSTARS
url http://www.sciencedirect.com/science/article/pii/S2214317318304554
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