Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy

Multi-target prediction of wheat flour quality parameters with near infrared spectroscopy

Near Infrared (NIR) spectroscopy is an analytical technology widely used for the non-destructive characterisation of organic samples, considering both qualitative and quantitative attributes. In the present study, the combination of Multi-target (MT) prediction approaches and Machine Learning algori...

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Bibliographic Details
Main Authors: Sylvio Barbon Junior, Saulo Martielo Mastelini, Ana Paula A.C. Barbon, Douglas Fernandes Barbin, Rosalba Calvini, Jessica Fernandes Lopes, Alessandro Ulrici
Format: Article
Language:English
Published: Elsevier 2020-06-01
Series:Information Processing in Agriculture
Subjects:
Random forest
Support Vector Machine
Near-infrared spectroscopy
Machine learning
MTRS
DSTARS
Online Access:http://www.sciencedirect.com/science/article/pii/S2214317318304554

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