Flexural Edge Waves in a Thick Piezoelectric Film Resting on a Winkler Foundation

This paper is concerned with the analysis of bending edge waves travelling in a thick Kirchhoff-type piezoelectric film resting on a Winkler–Fuss foundation. The electromechanical coupling is accounted for in defining flexural rigidities to embrace piezoelectric and dielectric material constants. Dy...

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Bibliographic Details
Main Authors: Saad Althobaiti, Muhammad A. Hawwa
Format: Article
Language:English
Published: MDPI AG 2022-04-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/12/5/640
Description
Summary:This paper is concerned with the analysis of bending edge waves travelling in a thick Kirchhoff-type piezoelectric film resting on a Winkler–Fuss foundation. The electromechanical coupling is accounted for in defining flexural rigidities to embrace piezoelectric and dielectric material constants. Dynamics is solved analytically and demonstrated numerically by assuming harmonic wave propagation. It is observed that an increase of the voltage leads to a decrease of the critical velocity, while an increase of the Winkler’s constant leads to an increase of the critical velocity.
ISSN:2073-4352