Insulator Metal Transition-Based Selector in Crossbar Memory Arrays

This article investigates resistive random access memory (ReRAM) crossbar memory arrays, which is a notable development in non-volatile memory technology. We highlight ReRAM’s competitive edge over NAND, NOR Flash, and phase-change memory (PCM), particularly in terms of endurance, speed, and energy...

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Main Authors: Mahmoud Darwish, László Pohl
פורמט: Article
שפה:English
יצא לאור: MDPI AG 2024-02-01
סדרה:Electronic Materials
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גישה מקוונת:https://www.mdpi.com/2673-3978/5/1/2