Experiment Study of Single Event Functional Interrupt in Analog-to-Digital Converters Using a Pulsed Laser

Experiment Study of Single Event Functional Interrupt in Analog-to-Digital Converters Using a Pulsed Laser

Single Event Functional Interrupt (SEFI) poses a severe threat to the normal operation of spacecraft. This paper investigates SEFI in Analog-to-Digital Converters (ADCs) with storage units using precision positioning of pulsed lasers. Based on the experiment, it was discovered that a bit flip in the...

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Bibliographic Details
Main Authors: Ziqi Mai, Xiang Zhu, Hongwei Li, Jianwei Han, Tao He
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:Electronics
Subjects:
SEE
SEFI
ADC
pulsed laser
Online Access:https://www.mdpi.com/2079-9292/12/13/2774

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