Mid-Level Data Fusion Combined with the Fingerprint Region for Classification DON Levels Defect of Fusarium Head Blight Wheat

Mid-Level Data Fusion Combined with the Fingerprint Region for Classification DON Levels Defect of Fusarium Head Blight Wheat

In this study, a method of mid-level data fusion with the fingerprint region was proposed, which was combined with the characteristic wavelengths that contain fingerprint information in NIR and FT-MIR spectra to detect the DON level in FHB wheat during wheat processing. NIR and FT-MIR raw spectrosco...

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Bibliographic Details
Main Authors: Kun Liang, Jinpeng Song, Rui Yuan, Zhizhou Ren
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Sensors
Subjects:
spectroscopic techniques
fusarium head blight
fingerprint region
data fusion
Online Access:https://www.mdpi.com/1424-8220/23/14/6600

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