High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics

Various strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent...

Full description

Bibliographic Details
Main Authors: Young Ki Hong, Geonwook Yoo, Junyeon Kwon, Seongin Hong, Won Geun Song, Na Liu, Inturu Omkaram, Byungwook Yoo, Sanghyun Ju, Sunkook Kim, Min Suk Oh
Format: Article
Language:English
Published: AIP Publishing LLC 2016-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4953062
_version_ 1828858785852030976
author Young Ki Hong
Geonwook Yoo
Junyeon Kwon
Seongin Hong
Won Geun Song
Na Liu
Inturu Omkaram
Byungwook Yoo
Sanghyun Ju
Sunkook Kim
Min Suk Oh
author_facet Young Ki Hong
Geonwook Yoo
Junyeon Kwon
Seongin Hong
Won Geun Song
Na Liu
Inturu Omkaram
Byungwook Yoo
Sanghyun Ju
Sunkook Kim
Min Suk Oh
author_sort Young Ki Hong
collection DOAJ
description Various strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent electronics with a high device performance, we have realized MoS2 TFTs with source/drain electrodes consisting of transparent bi-layers of a conducting oxide over a thin film of low work function metal. Intercalation of a low work function metal layer, such as aluminum, between MoS2 and transparent source/drain electrodes makes it possible to optimize the Schottky contact characteristics, resulting in about 24-fold and 3 orders of magnitude enhancement of the field-effect mobility and on-off current ratio, respectively, as well as transmittance of 87.4 % in the visible wavelength range.
first_indexed 2024-12-13T02:04:26Z
format Article
id doaj.art-79df7228df6347128f3761c43726890a
institution Directory Open Access Journal
issn 2158-3226
language English
last_indexed 2024-12-13T02:04:26Z
publishDate 2016-05-01
publisher AIP Publishing LLC
record_format Article
series AIP Advances
spelling doaj.art-79df7228df6347128f3761c43726890a2022-12-22T00:03:11ZengAIP Publishing LLCAIP Advances2158-32262016-05-0165055026055026-610.1063/1.4953062093605ADVHigh performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristicsYoung Ki Hong0Geonwook Yoo1Junyeon Kwon2Seongin Hong3Won Geun Song4Na Liu5Inturu Omkaram6Byungwook Yoo7Sanghyun Ju8Sunkook Kim9Min Suk Oh10Multi-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaDisplay Convergence Research Center, Korea Electronics Technology Institute, Gyeonggi 463-816, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaDisplay Convergence Research Center, Korea Electronics Technology Institute, Gyeonggi 463-816, South KoreaDepartment of Physics, Kyonggi University, Suwon, Gyeonggi-Do 443-760, South KoreaMulti-Functional Bio/Nano Lab., Kyung Hee University, Gyeonggi 446-701, South KoreaDisplay Convergence Research Center, Korea Electronics Technology Institute, Gyeonggi 463-816, South KoreaVarious strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent electronics with a high device performance, we have realized MoS2 TFTs with source/drain electrodes consisting of transparent bi-layers of a conducting oxide over a thin film of low work function metal. Intercalation of a low work function metal layer, such as aluminum, between MoS2 and transparent source/drain electrodes makes it possible to optimize the Schottky contact characteristics, resulting in about 24-fold and 3 orders of magnitude enhancement of the field-effect mobility and on-off current ratio, respectively, as well as transmittance of 87.4 % in the visible wavelength range.http://dx.doi.org/10.1063/1.4953062
spellingShingle Young Ki Hong
Geonwook Yoo
Junyeon Kwon
Seongin Hong
Won Geun Song
Na Liu
Inturu Omkaram
Byungwook Yoo
Sanghyun Ju
Sunkook Kim
Min Suk Oh
High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
AIP Advances
title High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
title_full High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
title_fullStr High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
title_full_unstemmed High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
title_short High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics
title_sort high performance and transparent multilayer mos2 transistors tuning schottky barrier characteristics
url http://dx.doi.org/10.1063/1.4953062
work_keys_str_mv AT youngkihong highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT geonwookyoo highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT junyeonkwon highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT seonginhong highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT wongeunsong highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT naliu highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT inturuomkaram highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT byungwookyoo highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT sanghyunju highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT sunkookkim highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics
AT minsukoh highperformanceandtransparentmultilayermos2transistorstuningschottkybarriercharacteristics