High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads
Self-assembled donor–acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparen...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2016-06-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.7.71 |
| _version_ | 1819144545663713280 |
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| author | Benjamin Grévin Pierre-Olivier Schwartz Laure Biniek Martin Brinkmann Nicolas Leclerc Elena Zaborova Stéphane Méry |
| author_facet | Benjamin Grévin Pierre-Olivier Schwartz Laure Biniek Martin Brinkmann Nicolas Leclerc Elena Zaborova Stéphane Méry |
| author_sort | Benjamin Grévin |
| collection | DOAJ |
| description | Self-assembled donor–acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparent indium tin oxide substrates are investigated in dark conditions and upon illumination. The topographic and contact potential difference (CPD) images taken under dark conditions are analysed in view of the results of complementary transmission electron microscopy (TEM) experiments. After in situ annealing, it is shown that the dyads with longer donor blocks essentially lead to standing acceptor–donor lamellae, where the acceptor and donor groups are π-stacked in an edge-on configuration. The existence of strong CPD and surface photo-voltage (SPV) contrasts shows that structural variations occur within the bulk of the edge-on stacks. SPV images with a very high lateral resolution are achieved, which allows for the resolution of local photo-charging contrasts at the scale of single edge-on lamella. This work paves the way for local investigations of the optoelectronic properties of donor–acceptor supramolecular architectures down to the elementary building block level. |
| first_indexed | 2024-12-22T12:43:51Z |
| format | Article |
| id | doaj.art-7ace135c17d648c299ccfea91775a438 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-22T12:43:51Z |
| publishDate | 2016-06-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-7ace135c17d648c299ccfea91775a4382022-12-21T18:25:22ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862016-06-017179980810.3762/bjnano.7.712190-4286-7-71High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyadsBenjamin Grévin0Pierre-Olivier Schwartz1Laure Biniek2Martin Brinkmann3Nicolas Leclerc4Elena Zaborova5Stéphane Méry6University Grenoble Alpes, INAC-SPrAM, 38000 Grenoble, FranceInstitut de Physique et de Chimie des Matériaux de Strasbourg, Université de Strasbourg, CNRS UMR 7504, 23 rue du Loess, BP 43, 67034 Strasbourg Cedex 2, FranceInstitut Charles Sadron, CNRS, Université de Strasbourg, 23 rue du Loess, BP 84047, 67034 Strasbourg Cedex 2, France,Institut Charles Sadron, CNRS, Université de Strasbourg, 23 rue du Loess, BP 84047, 67034 Strasbourg Cedex 2, France,Institut de Chimie et Procédés pour l’Energie, l’Environnement et la santé (ICPEES), Université de Strasbourg, CNRS UMR 7515, ECPM, 25 rue Becquerel, 67087 Strasbourg Cedex 2, FranceInstitut de Chimie et Procédés pour l’Energie, l’Environnement et la santé (ICPEES), Université de Strasbourg, CNRS UMR 7515, ECPM, 25 rue Becquerel, 67087 Strasbourg Cedex 2, FranceInstitut de Physique et de Chimie des Matériaux de Strasbourg, Université de Strasbourg, CNRS UMR 7504, 23 rue du Loess, BP 43, 67034 Strasbourg Cedex 2, FranceSelf-assembled donor–acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparent indium tin oxide substrates are investigated in dark conditions and upon illumination. The topographic and contact potential difference (CPD) images taken under dark conditions are analysed in view of the results of complementary transmission electron microscopy (TEM) experiments. After in situ annealing, it is shown that the dyads with longer donor blocks essentially lead to standing acceptor–donor lamellae, where the acceptor and donor groups are π-stacked in an edge-on configuration. The existence of strong CPD and surface photo-voltage (SPV) contrasts shows that structural variations occur within the bulk of the edge-on stacks. SPV images with a very high lateral resolution are achieved, which allows for the resolution of local photo-charging contrasts at the scale of single edge-on lamella. This work paves the way for local investigations of the optoelectronic properties of donor–acceptor supramolecular architectures down to the elementary building block level.https://doi.org/10.3762/bjnano.7.71donor–acceptor co-oligomersdonor–acceptor lamellaedonor–acceptor-ordered bulk heterojunctionKelvin probe force microscopy (KPFM)noncontact atomic force microscopy (nc-AFM)organic photovoltaicssurface photo-voltage (SPV) |
| spellingShingle | Benjamin Grévin Pierre-Olivier Schwartz Laure Biniek Martin Brinkmann Nicolas Leclerc Elena Zaborova Stéphane Méry High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads Beilstein Journal of Nanotechnology donor–acceptor co-oligomers donor–acceptor lamellae donor–acceptor-ordered bulk heterojunction Kelvin probe force microscopy (KPFM) noncontact atomic force microscopy (nc-AFM) organic photovoltaics surface photo-voltage (SPV) |
| title | High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads |
| title_full | High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads |
| title_fullStr | High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads |
| title_full_unstemmed | High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads |
| title_short | High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads |
| title_sort | high resolution noncontact afm and kelvin probe force microscopy investigations of self assembled photovoltaic donor acceptor dyads |
| topic | donor–acceptor co-oligomers donor–acceptor lamellae donor–acceptor-ordered bulk heterojunction Kelvin probe force microscopy (KPFM) noncontact atomic force microscopy (nc-AFM) organic photovoltaics surface photo-voltage (SPV) |
| url | https://doi.org/10.3762/bjnano.7.71 |
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