Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
In this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffus...
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MDPI AG
2021-06-01
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author | Michał Pawlak Timo Kruck Nikolai Spitzer Dariusz Dziczek Arne Ludwig Andreas D. Wieck |
author_facet | Michał Pawlak Timo Kruck Nikolai Spitzer Dariusz Dziczek Arne Ludwig Andreas D. Wieck |
author_sort | Michał Pawlak |
collection | DOAJ |
description | In this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffusivity and in-plane thermal conductivity. We find that the most common formula for calculating thermal diffusivity and heat capacity (and density) can be used in a temperature range of −50 °C to 50 °C. This confirms that the heat capacity in the very thin silicon membranes is the same as in bulk silicon, as was preliminary investigated using an elastic continuum model. Based on the obtained thermal parameters, we can fully characterize the sample using a new procedure for characterization of the in-plane and cross-plane thermal transport properties of thin-layer and superlattice semiconductor samples. |
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issn | 2076-3417 |
language | English |
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spelling | doaj.art-7ad8d014af86466ab71e8dfd384589b52023-11-22T02:33:23ZengMDPI AGApplied Sciences2076-34172021-06-011113612510.3390/app11136125Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and ThermoreflectanceMichał Pawlak0Timo Kruck1Nikolai Spitzer2Dariusz Dziczek3Arne Ludwig4Andreas D. Wieck5Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University, Grudziadzka 5, 87-100 Torun, PolandChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyInstitute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University, Grudziadzka 5, 87-100 Torun, PolandChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyIn this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffusivity and in-plane thermal conductivity. We find that the most common formula for calculating thermal diffusivity and heat capacity (and density) can be used in a temperature range of −50 °C to 50 °C. This confirms that the heat capacity in the very thin silicon membranes is the same as in bulk silicon, as was preliminary investigated using an elastic continuum model. Based on the obtained thermal parameters, we can fully characterize the sample using a new procedure for characterization of the in-plane and cross-plane thermal transport properties of thin-layer and superlattice semiconductor samples.https://www.mdpi.com/2076-3417/11/13/6125superlatticethin filmsthermal transportthermal wave methods |
spellingShingle | Michał Pawlak Timo Kruck Nikolai Spitzer Dariusz Dziczek Arne Ludwig Andreas D. Wieck Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance Applied Sciences superlattice thin films thermal transport thermal wave methods |
title | Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance |
title_full | Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance |
title_fullStr | Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance |
title_full_unstemmed | Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance |
title_short | Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance |
title_sort | experimental validation of formula for calculation thermal diffusivity in superlattices performed using a combination of two frequency domain methods photothermal infrared radiometry and thermoreflectance |
topic | superlattice thin films thermal transport thermal wave methods |
url | https://www.mdpi.com/2076-3417/11/13/6125 |
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