Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance

In this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffus...

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Main Authors: Michał Pawlak, Timo Kruck, Nikolai Spitzer, Dariusz Dziczek, Arne Ludwig, Andreas D. Wieck
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/11/13/6125
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author Michał Pawlak
Timo Kruck
Nikolai Spitzer
Dariusz Dziczek
Arne Ludwig
Andreas D. Wieck
author_facet Michał Pawlak
Timo Kruck
Nikolai Spitzer
Dariusz Dziczek
Arne Ludwig
Andreas D. Wieck
author_sort Michał Pawlak
collection DOAJ
description In this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffusivity and in-plane thermal conductivity. We find that the most common formula for calculating thermal diffusivity and heat capacity (and density) can be used in a temperature range of −50 °C to 50 °C. This confirms that the heat capacity in the very thin silicon membranes is the same as in bulk silicon, as was preliminary investigated using an elastic continuum model. Based on the obtained thermal parameters, we can fully characterize the sample using a new procedure for characterization of the in-plane and cross-plane thermal transport properties of thin-layer and superlattice semiconductor samples.
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spelling doaj.art-7ad8d014af86466ab71e8dfd384589b52023-11-22T02:33:23ZengMDPI AGApplied Sciences2076-34172021-06-011113612510.3390/app11136125Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and ThermoreflectanceMichał Pawlak0Timo Kruck1Nikolai Spitzer2Dariusz Dziczek3Arne Ludwig4Andreas D. Wieck5Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University, Grudziadzka 5, 87-100 Torun, PolandChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyInstitute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University, Grudziadzka 5, 87-100 Torun, PolandChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyChair of Applied Solid-State Physics, Experimental Physics VI, Ruhr-University Bochum, Universitaetsstrasse 150, D-44780 Bochum, GermanyIn this paper, we validate two theoretical formula used to characterize thermal transport of superlattices at different temperatures. These formulas are used to measure cross-plane thermal conductivity and thermal boundary resistance, when it is not possible to obtain heat capacity or thermal diffusivity and in-plane thermal conductivity. We find that the most common formula for calculating thermal diffusivity and heat capacity (and density) can be used in a temperature range of −50 °C to 50 °C. This confirms that the heat capacity in the very thin silicon membranes is the same as in bulk silicon, as was preliminary investigated using an elastic continuum model. Based on the obtained thermal parameters, we can fully characterize the sample using a new procedure for characterization of the in-plane and cross-plane thermal transport properties of thin-layer and superlattice semiconductor samples.https://www.mdpi.com/2076-3417/11/13/6125superlatticethin filmsthermal transportthermal wave methods
spellingShingle Michał Pawlak
Timo Kruck
Nikolai Spitzer
Dariusz Dziczek
Arne Ludwig
Andreas D. Wieck
Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
Applied Sciences
superlattice
thin films
thermal transport
thermal wave methods
title Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
title_full Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
title_fullStr Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
title_full_unstemmed Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
title_short Experimental Validation of Formula for Calculation Thermal Diffusivity in Superlattices Performed Using a Combination of Two Frequency-Domain Methods: Photothermal Infrared Radiometry and Thermoreflectance
title_sort experimental validation of formula for calculation thermal diffusivity in superlattices performed using a combination of two frequency domain methods photothermal infrared radiometry and thermoreflectance
topic superlattice
thin films
thermal transport
thermal wave methods
url https://www.mdpi.com/2076-3417/11/13/6125
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