Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems
In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to the...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-01-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/21/1/238 |
| _version_ | 1827698631297204224 |
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| author | Jakub Šalplachta Tomáš Zikmund Marek Zemek Adam Břínek Yoshihiro Takeda Kazuhiko Omote Jozef Kaiser |
| author_facet | Jakub Šalplachta Tomáš Zikmund Marek Zemek Adam Břínek Yoshihiro Takeda Kazuhiko Omote Jozef Kaiser |
| author_sort | Jakub Šalplachta |
| collection | DOAJ |
| description | In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal–oxide–semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts’ detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample’s structure. |
| first_indexed | 2024-03-10T13:32:59Z |
| format | Article |
| id | doaj.art-7b98b77773344549a1b446ffe7ad269f |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T13:32:59Z |
| publishDate | 2021-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-7b98b77773344549a1b446ffe7ad269f2023-11-21T07:44:19ZengMDPI AGSensors1424-82202021-01-0121123810.3390/s21010238Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT SystemsJakub Šalplachta0Tomáš Zikmund1Marek Zemek2Adam Břínek3Yoshihiro Takeda4Kazuhiko Omote5Jozef Kaiser6CEITEC—Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech RepublicCEITEC—Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech RepublicCEITEC—Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech RepublicCEITEC—Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech RepublicRigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, JapanRigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, JapanCEITEC—Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech RepublicIn this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal–oxide–semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts’ detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample’s structure.https://www.mdpi.com/1424-8220/21/1/238ring artifacts reductionCCD detectorsCMOS detectorhigh-resolution X-ray computed tomographyrelative total variation |
| spellingShingle | Jakub Šalplachta Tomáš Zikmund Marek Zemek Adam Břínek Yoshihiro Takeda Kazuhiko Omote Jozef Kaiser Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems Sensors ring artifacts reduction CCD detector sCMOS detector high-resolution X-ray computed tomography relative total variation |
| title | Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems |
| title_full | Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems |
| title_fullStr | Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems |
| title_full_unstemmed | Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems |
| title_short | Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems |
| title_sort | complete ring artifacts reduction procedure for lab based x ray nano ct systems |
| topic | ring artifacts reduction CCD detector sCMOS detector high-resolution X-ray computed tomography relative total variation |
| url | https://www.mdpi.com/1424-8220/21/1/238 |
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