Soft X-Ray Polarimeter: Potential Instrumentation and Observations

Soft X-Ray Polarimeter: Potential Instrumentation and Observations

We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine t...

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Bibliographic Details
Main Authors: Herman L. Marshall, Norbert S. Schulz
Format: Article
Language:English
Published: CTU Central Library 2014-12-01
Series:Acta Polytechnica CTU Proceedings
Online Access:https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422

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