Operational properties of fluctuation X-ray scattering data
X-ray scattering images collected on timescales shorter than rotation diffusion times using a (partially) coherent beam result in a significant increase in information content in the scattered data. These measurements, named fluctuation X-ray scattering (FXS), are typically performed on an X-ray fre...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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International Union of Crystallography
2015-05-01
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| Series: | IUCrJ |
| Subjects: | |
| Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252515002535 |
| _version_ | 1818322042387169280 |
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| author | Erik Malmerberg Cheryl A. Kerfeld Petrus H. Zwart |
| author_facet | Erik Malmerberg Cheryl A. Kerfeld Petrus H. Zwart |
| author_sort | Erik Malmerberg |
| collection | DOAJ |
| description | X-ray scattering images collected on timescales shorter than rotation diffusion times using a (partially) coherent beam result in a significant increase in information content in the scattered data. These measurements, named fluctuation X-ray scattering (FXS), are typically performed on an X-ray free-electron laser (XFEL) and can provide fundamental insights into the structure of biological molecules, engineered nanoparticles or energy-related mesoscopic materials beyond what can be obtained with standard X-ray scattering techniques. In order to understand, use and validate experimental FXS data, the availability of basic data characteristics and operational properties is essential, but has been absent up to this point. In this communication, an intuitive view of the nature of FXS data and their properties is provided, the effect of FXS data on the derived structural models is highlighted, and generalizations of the Guinier and Porod laws that can ultimately be used to plan experiments and assess the quality of experimental data are presented. |
| first_indexed | 2024-12-13T10:50:30Z |
| format | Article |
| id | doaj.art-7c3f7b756ebb454cb0469613a2dfc3e7 |
| institution | Directory Open Access Journal |
| issn | 2052-2525 |
| language | English |
| last_indexed | 2024-12-13T10:50:30Z |
| publishDate | 2015-05-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | IUCrJ |
| spelling | doaj.art-7c3f7b756ebb454cb0469613a2dfc3e72022-12-21T23:49:53ZengInternational Union of CrystallographyIUCrJ2052-25252015-05-012330931610.1107/S2052252515002535dc5005Operational properties of fluctuation X-ray scattering dataErik Malmerberg0Cheryl A. Kerfeld1Petrus H. Zwart2Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, USAPhysical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, USAPhysical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, USAX-ray scattering images collected on timescales shorter than rotation diffusion times using a (partially) coherent beam result in a significant increase in information content in the scattered data. These measurements, named fluctuation X-ray scattering (FXS), are typically performed on an X-ray free-electron laser (XFEL) and can provide fundamental insights into the structure of biological molecules, engineered nanoparticles or energy-related mesoscopic materials beyond what can be obtained with standard X-ray scattering techniques. In order to understand, use and validate experimental FXS data, the availability of basic data characteristics and operational properties is essential, but has been absent up to this point. In this communication, an intuitive view of the nature of FXS data and their properties is provided, the effect of FXS data on the derived structural models is highlighted, and generalizations of the Guinier and Porod laws that can ultimately be used to plan experiments and assess the quality of experimental data are presented.http://scripts.iucr.org/cgi-bin/paper?S2052252515002535fluctuation X-ray scatteringXFELSbiological moleculesnanoparticlesmesoscopic materials |
| spellingShingle | Erik Malmerberg Cheryl A. Kerfeld Petrus H. Zwart Operational properties of fluctuation X-ray scattering data IUCrJ fluctuation X-ray scattering XFELS biological molecules nanoparticles mesoscopic materials |
| title | Operational properties of fluctuation X-ray scattering data |
| title_full | Operational properties of fluctuation X-ray scattering data |
| title_fullStr | Operational properties of fluctuation X-ray scattering data |
| title_full_unstemmed | Operational properties of fluctuation X-ray scattering data |
| title_short | Operational properties of fluctuation X-ray scattering data |
| title_sort | operational properties of fluctuation x ray scattering data |
| topic | fluctuation X-ray scattering XFELS biological molecules nanoparticles mesoscopic materials |
| url | http://scripts.iucr.org/cgi-bin/paper?S2052252515002535 |
| work_keys_str_mv | AT erikmalmerberg operationalpropertiesoffluctuationxrayscatteringdata AT cherylakerfeld operationalpropertiesoffluctuationxrayscatteringdata AT petrushzwart operationalpropertiesoffluctuationxrayscatteringdata |