Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene

The radiothermal ageing of silane-crosslinked low-density PE (Si-XLPE) films was studied in the air under three different <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">γ&...

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Main Authors: Sarah Hettal, Sébastien Roland, Xavier Colin
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Polymers
Subjects:
Online Access:https://www.mdpi.com/2073-4360/14/14/2912
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author Sarah Hettal
Sébastien Roland
Xavier Colin
author_facet Sarah Hettal
Sébastien Roland
Xavier Colin
author_sort Sarah Hettal
collection DOAJ
description The radiothermal ageing of silane-crosslinked low-density PE (Si-XLPE) films was studied in the air under three different <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">γ</mi></semantics></math></inline-formula> dose rates (8.5, 77.8, and 400 Gy·h<sup>−1</sup>) at a low temperature close to ambient (47, 47, and 21 °C, respectively). Changes in crystalline morphology were investigated using a multi-technique approach based on differential scanning calorimetry (DSC), wide- (WAXS) and small-angle X-ray scattering (SAXS), and density measurements. In particular, the changes in four structural variables were accurately monitored during radiothermal ageing: crystallinity ratio (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">X</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>), crystalline lamellae thickness (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>), long period (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">p</mi></msub></mrow></semantics></math></inline-formula>), and interlamellar spacing (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">a</mi></msub></mrow></semantics></math></inline-formula>). Concerning the changes in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">X</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>, a perfect agreement was found between DSC and WAXS experiments. Successive sequences of self-nucleation and annealing (SSA) were also performed on aged Si-XLPE samples in the DSC chamber in order to assess the thickness distribution of crystalline lamellae. This method allowed the thermally splitting of the melting domain of Si-XLPE into a series of elementary melting peaks, with each one characterised by a distinct thickness of crystalline lamellae. DSC (used with the SSA method) showed a slight increase in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula> during the oxidation of Si-XLPE, while SAXS confirmed a catastrophic decrease in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">a</mi></msub></mrow></semantics></math></inline-formula>. The critical value of the interlamellar spacing characterising the ductile/brittle transition of Si-XLPE was found to be of the same order of magnitude as that for linear polyethylene (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mrow><mi>aF</mi></mrow></msub><mo>≈</mo><mn>6</mn></mrow></semantics></math></inline-formula> nm). This structural end-of-life criterion can now be used for predicting the lifetime of Si-XLPE in a nuclear environment.
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spelling doaj.art-7e638dda6ebc488bb52c4989a9d5d76b2023-12-01T22:36:54ZengMDPI AGPolymers2073-43602022-07-011414291210.3390/polym14142912Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked PolyethyleneSarah Hettal0Sébastien Roland1Xavier Colin2Laboratoire Procédés et Ingénierie en Mécanique et Matériaux, Arts et Métiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l’Hôpital, 75013 Paris, FranceLaboratoire Procédés et Ingénierie en Mécanique et Matériaux, Arts et Métiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l’Hôpital, 75013 Paris, FranceLaboratoire Procédés et Ingénierie en Mécanique et Matériaux, Arts et Métiers Institute of Technology, CNRS, CNAM, HESAM University, 151 Boulevard de l’Hôpital, 75013 Paris, FranceThe radiothermal ageing of silane-crosslinked low-density PE (Si-XLPE) films was studied in the air under three different <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">γ</mi></semantics></math></inline-formula> dose rates (8.5, 77.8, and 400 Gy·h<sup>−1</sup>) at a low temperature close to ambient (47, 47, and 21 °C, respectively). Changes in crystalline morphology were investigated using a multi-technique approach based on differential scanning calorimetry (DSC), wide- (WAXS) and small-angle X-ray scattering (SAXS), and density measurements. In particular, the changes in four structural variables were accurately monitored during radiothermal ageing: crystallinity ratio (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">X</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>), crystalline lamellae thickness (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>), long period (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">p</mi></msub></mrow></semantics></math></inline-formula>), and interlamellar spacing (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">a</mi></msub></mrow></semantics></math></inline-formula>). Concerning the changes in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">X</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula>, a perfect agreement was found between DSC and WAXS experiments. Successive sequences of self-nucleation and annealing (SSA) were also performed on aged Si-XLPE samples in the DSC chamber in order to assess the thickness distribution of crystalline lamellae. This method allowed the thermally splitting of the melting domain of Si-XLPE into a series of elementary melting peaks, with each one characterised by a distinct thickness of crystalline lamellae. DSC (used with the SSA method) showed a slight increase in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">C</mi></msub></mrow></semantics></math></inline-formula> during the oxidation of Si-XLPE, while SAXS confirmed a catastrophic decrease in <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mi mathvariant="normal">a</mi></msub></mrow></semantics></math></inline-formula>. The critical value of the interlamellar spacing characterising the ductile/brittle transition of Si-XLPE was found to be of the same order of magnitude as that for linear polyethylene (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi mathvariant="normal">L</mi><mrow><mi>aF</mi></mrow></msub><mo>≈</mo><mn>6</mn></mrow></semantics></math></inline-formula> nm). This structural end-of-life criterion can now be used for predicting the lifetime of Si-XLPE in a nuclear environment.https://www.mdpi.com/2073-4360/14/14/2912silane-crosslinked polyethyleneradiothermal oxidationchain scissionschemicrystallisationlamellar thickeningembrittlement
spellingShingle Sarah Hettal
Sébastien Roland
Xavier Colin
Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
Polymers
silane-crosslinked polyethylene
radiothermal oxidation
chain scissions
chemicrystallisation
lamellar thickening
embrittlement
title Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
title_full Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
title_fullStr Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
title_full_unstemmed Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
title_short Consequences of Radiothermal Ageing on the Crystalline Morphology of Additive-Free Silane-Crosslinked Polyethylene
title_sort consequences of radiothermal ageing on the crystalline morphology of additive free silane crosslinked polyethylene
topic silane-crosslinked polyethylene
radiothermal oxidation
chain scissions
chemicrystallisation
lamellar thickening
embrittlement
url https://www.mdpi.com/2073-4360/14/14/2912
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AT xaviercolin consequencesofradiothermalageingonthecrystallinemorphologyofadditivefreesilanecrosslinkedpolyethylene