Analog Performance and its Variability in Sub-10 nm Fin-Width FinFETs: a Detailed Analysis

Analog Performance and its Variability in Sub-10 nm Fin-Width FinFETs: a Detailed Analysis

This paper discusses in detail the effects of Sub-10nm fin-width (Wfin) on the analog performance and variability of FinFETs. It is observed through detailed measurements that the transconductance degrades and output conductance improves with the reduction in fin-width. Through different analog perf...

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Bibliographic Details
Main Authors: Mandar S. Bhoir, Thomas Chiarella, Lars Ake Ragnarsson, Jerome Mitard, Valentina Terzeiva, Naoto Horiguchi, Nihar R. Mohapatra
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
FinFET
sub-10nm fin-width
technology scaling
analog/RF
variability
transconductance
Online Access:https://ieeexplore.ieee.org/document/8794627/

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