FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization

In recent years, a multitude of self-supervised anomaly detection algorithms have been proposed. Among them, PatchCore has emerged as one of the state-of-the-art methods on the widely used MVTec AD benchmark due to its efficient detection capabilities and cost-saving advantages in terms of labeled d...

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Main Authors: Zhiqian Jiang, Yu Zhang, Yong Wang, Jinlong Li, Xiaorong Gao
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/24/5/1368
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author Zhiqian Jiang
Yu Zhang
Yong Wang
Jinlong Li
Xiaorong Gao
author_facet Zhiqian Jiang
Yu Zhang
Yong Wang
Jinlong Li
Xiaorong Gao
author_sort Zhiqian Jiang
collection DOAJ
description In recent years, a multitude of self-supervised anomaly detection algorithms have been proposed. Among them, PatchCore has emerged as one of the state-of-the-art methods on the widely used MVTec AD benchmark due to its efficient detection capabilities and cost-saving advantages in terms of labeled data. However, we have identified that the PatchCore similarity principal approach faces significant limitations in accurately locating anomalies when there are positional relationships between similar samples, such as rotation, flipping, or misaligned pixels. In real-world industrial scenarios, it is common for samples of the same class to be found in different positions. To address this challenge comprehensively, we introduce Feature-Level Registration PatchCore (FR-PatchCore), which serves as an extension of the PatchCore method. FR-PatchCore constructs a feature matrix that is extracted into the memory bank and continually updated using the optimal negative cosine similarity loss. Extensive evaluations conducted on the MVTec AD benchmark demonstrate that FR-PatchCore achieves an impressive image-level anomaly detection AUROC score of up to 98.81%. Additionally, we propose a novel method for computing the mask threshold that enables the model to scientifically determine the optimal threshold and accurately partition anomalous masks. Our results highlight not only the high generalizability but also substantial potential for industrial anomaly detection offered by FR-PatchCore.
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spelling doaj.art-7efb70bf3d8a446abd46636fb5d7903a2024-03-12T16:54:32ZengMDPI AGSensors1424-82202024-02-01245136810.3390/s24051368FR-PatchCore: An Industrial Anomaly Detection Method for Improving GeneralizationZhiqian Jiang0Yu Zhang1Yong Wang2Jinlong Li3Xiaorong Gao4School of Physical Science and Technology, Southwest Jiaotong University, Chengdu 611756, ChinaSchool of Physical Science and Technology, Southwest Jiaotong University, Chengdu 611756, ChinaSchool of Physical Science and Technology, Southwest Jiaotong University, Chengdu 611756, ChinaSchool of Physical Science and Technology, Southwest Jiaotong University, Chengdu 611756, ChinaSchool of Physical Science and Technology, Southwest Jiaotong University, Chengdu 611756, ChinaIn recent years, a multitude of self-supervised anomaly detection algorithms have been proposed. Among them, PatchCore has emerged as one of the state-of-the-art methods on the widely used MVTec AD benchmark due to its efficient detection capabilities and cost-saving advantages in terms of labeled data. However, we have identified that the PatchCore similarity principal approach faces significant limitations in accurately locating anomalies when there are positional relationships between similar samples, such as rotation, flipping, or misaligned pixels. In real-world industrial scenarios, it is common for samples of the same class to be found in different positions. To address this challenge comprehensively, we introduce Feature-Level Registration PatchCore (FR-PatchCore), which serves as an extension of the PatchCore method. FR-PatchCore constructs a feature matrix that is extracted into the memory bank and continually updated using the optimal negative cosine similarity loss. Extensive evaluations conducted on the MVTec AD benchmark demonstrate that FR-PatchCore achieves an impressive image-level anomaly detection AUROC score of up to 98.81%. Additionally, we propose a novel method for computing the mask threshold that enables the model to scientifically determine the optimal threshold and accurately partition anomalous masks. Our results highlight not only the high generalizability but also substantial potential for industrial anomaly detection offered by FR-PatchCore.https://www.mdpi.com/1424-8220/24/5/1368image anomaly detectionself-supervised learningfeature processing
spellingShingle Zhiqian Jiang
Yu Zhang
Yong Wang
Jinlong Li
Xiaorong Gao
FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
Sensors
image anomaly detection
self-supervised learning
feature processing
title FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
title_full FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
title_fullStr FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
title_full_unstemmed FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
title_short FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
title_sort fr patchcore an industrial anomaly detection method for improving generalization
topic image anomaly detection
self-supervised learning
feature processing
url https://www.mdpi.com/1424-8220/24/5/1368
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