A Terahertz Fast-Sweep Optoelectronic Frequency-Domain Spectrometer: Calibration, Performance Tests, and Comparison with TDS and FDS
We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-08-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/12/16/8257 |
Summary: | We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using atmospheric water vapour lines and a silicon wafer etalon; the amplitude linearity is verified using a set of silicon plates. Instrument performance is tested by measuring transmission properties of a variety of representative samples and comparing with a time-domain spectrometer and a frequency-domain spectrometer. |
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ISSN: | 2076-3417 |