A Terahertz Fast-Sweep Optoelectronic Frequency-Domain Spectrometer: Calibration, Performance Tests, and Comparison with TDS and FDS

We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using...

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Bibliographic Details
Main Authors: Janis Kutz, Lars Liebermeister, Nico Vieweg, Konstantin Wenzel, Robert Kohlhaas, Mira Naftaly
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/16/8257
Description
Summary:We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using atmospheric water vapour lines and a silicon wafer etalon; the amplitude linearity is verified using a set of silicon plates. Instrument performance is tested by measuring transmission properties of a variety of representative samples and comparing with a time-domain spectrometer and a frequency-domain spectrometer.
ISSN:2076-3417