Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the auth...
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Format: | Article |
Language: | English |
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Nature Portfolio
2020-06-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-020-17043-5 |
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author | Seth Kenkel Shachi Mittal Rohit Bhargava |
author_facet | Seth Kenkel Shachi Mittal Rohit Bhargava |
author_sort | Seth Kenkel |
collection | DOAJ |
description | Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods. |
first_indexed | 2024-12-18T00:33:12Z |
format | Article |
id | doaj.art-7f60d745978c43e895338ddbcc95cafe |
institution | Directory Open Access Journal |
issn | 2041-1723 |
language | English |
last_indexed | 2024-12-18T00:33:12Z |
publishDate | 2020-06-01 |
publisher | Nature Portfolio |
record_format | Article |
series | Nature Communications |
spelling | doaj.art-7f60d745978c43e895338ddbcc95cafe2022-12-21T21:27:05ZengNature PortfolioNature Communications2041-17232020-06-0111111010.1038/s41467-020-17043-5Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterizationSeth Kenkel0Shachi Mittal1Rohit Bhargava2Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignBeckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignBeckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignAtomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.https://doi.org/10.1038/s41467-020-17043-5 |
spellingShingle | Seth Kenkel Shachi Mittal Rohit Bhargava Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization Nature Communications |
title | Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization |
title_full | Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization |
title_fullStr | Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization |
title_full_unstemmed | Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization |
title_short | Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization |
title_sort | closed loop atomic force microscopy infrared spectroscopic imaging for nanoscale molecular characterization |
url | https://doi.org/10.1038/s41467-020-17043-5 |
work_keys_str_mv | AT sethkenkel closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization AT shachimittal closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization AT rohitbhargava closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization |