Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization

Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the auth...

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Main Authors: Seth Kenkel, Shachi Mittal, Rohit Bhargava
Format: Article
Language:English
Published: Nature Portfolio 2020-06-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-020-17043-5
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author Seth Kenkel
Shachi Mittal
Rohit Bhargava
author_facet Seth Kenkel
Shachi Mittal
Rohit Bhargava
author_sort Seth Kenkel
collection DOAJ
description Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.
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spelling doaj.art-7f60d745978c43e895338ddbcc95cafe2022-12-21T21:27:05ZengNature PortfolioNature Communications2041-17232020-06-0111111010.1038/s41467-020-17043-5Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterizationSeth Kenkel0Shachi Mittal1Rohit Bhargava2Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignBeckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignBeckman Institute for Advanced Science and Technology, University of Illinois at Urbana ChampaignAtomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.https://doi.org/10.1038/s41467-020-17043-5
spellingShingle Seth Kenkel
Shachi Mittal
Rohit Bhargava
Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
Nature Communications
title Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_full Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_fullStr Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_full_unstemmed Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_short Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_sort closed loop atomic force microscopy infrared spectroscopic imaging for nanoscale molecular characterization
url https://doi.org/10.1038/s41467-020-17043-5
work_keys_str_mv AT sethkenkel closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization
AT shachimittal closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization
AT rohitbhargava closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization