Research on junction temperature detection method of power electronic devices based on turn-off time and turn-off loss

Research on junction temperature detection method of power electronic devices based on turn-off time and turn-off loss

The temperature-sensitive electrical parameter (TSEP) method is widely used in the extraction and prediction of junction temperature (Tj) of power semiconductor devices. In this paper, turn-off loss (Eoff) and turn-off time (toff) are taken as temperature-sensitive electrical parameters. It is prove...

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Bibliographic Details
Main Authors: Lingfeng Shao, Guoqing Xu, Weiwei Wei, Xichun Zhang, Huiyun Li, Luhai Zheng, Hui Zhao
Format: Article
Language:English
Published: Elsevier 2022-04-01
Series:Energy Reports
Subjects:
Insulated gate bipolar transistor (IGBT)
Online junction temperature extraction
Turn-off delay time
Turn-off loss
Online Access:http://www.sciencedirect.com/science/article/pii/S2352484721012208

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