Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA

Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA

Aiming at the problems of nonlinearity and serious confusion of fault characteristics in analog circuits, this paper proposed a fault diagnosis method for an analog circuit based on ensemble empirical pattern decomposition (EEMD) and improved multifractal detrended fluctuations analysis (MF-DFA). Th...

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Bibliographic Details
Main Authors: Xinmiao Lu, Zihan Lu, Qiong Wu, Jiaxu Wang, Cunfang Yang, Shuai Sun, Dan Shao, Kaiyi Liu
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Electronics
Subjects:
ensemble empirical pattern decomposition (EEMD)
multifractal
detrended fluctuations analysis (DFA)
support vector machines (SVM)
circuit fault diagnosis
Online Access:https://www.mdpi.com/2079-9292/12/1/114

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