CuAlS2 thin films – Dip coating deposition and characterization
CuAlS2 thin films were deposited by a dip coating technique at room temperature. The X-ray energy dispersive (EDAX) and X-ray diffraction (XRD) analysis showed that the deposited CuAlS2 thin film is nearly stoichiometric and possesses a tetragonal unit cell structure. The crystallite sizes determine...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2017-06-01
|
| Series: | Journal of Science: Advanced Materials and Devices |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S246821791630171X |