An Automatic Offset Calibration Method for Differential Charge-Based Capacitance Measurement
Charge-Based Capacitance Measurement (CBCM) technique is a simple but effective technique for measuring capacitance values down to the attofarad level. However, when adopted for fully on-chip implementation, this technique suffers output offset caused by mismatches and process variations. This paper...
| Những tác giả chính: | , , , |
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| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Được phát hành: |
MDPI AG
2021-05-01
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| Loạt: | Journal of Low Power Electronics and Applications |
| Những chủ đề: | |
| Truy cập trực tuyến: | https://www.mdpi.com/2079-9268/11/2/22 |