Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By f...
Main Authors: | Enrique A. López-Guerra, Santiago D. Solares |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2017-10-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.8.223 |
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