Toward fast and accurate machine learning interatomic potentials for atomic layer deposition precursors
Under thin film deposition, when used in conjunction with the semiconductor atomic layer deposition (ALD) method, the choice of precursor determines the properties and quality of the thin film. Organometallic precursors such as alkaline earth metals (Sr and Ba) and group 4 transition metals (Zr and...
Main Authors: | Seungpyo Kang, Joonchul Kim, Taehyun Park, Joonghee Won, Chul Baik, Jungim Han, Kyoungmin Min |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2024-03-01
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Series: | Materials Today Advances |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2590049824000110 |
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