The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror

The uniformity and consistency of X-ray mirror film materials prepared by experimental methods are difficult to guarantee completely. These factors directly affect the service life of free electron laser devices in addition to its own optical properties. Therefore, the quality of the film material,...

Full description

Bibliographic Details
Main Authors: Tingting Sui, Haohui Zhuo, Anchun Tang, Xin Ju
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/17/5/1026
_version_ 1797264230255165440
author Tingting Sui
Haohui Zhuo
Anchun Tang
Xin Ju
author_facet Tingting Sui
Haohui Zhuo
Anchun Tang
Xin Ju
author_sort Tingting Sui
collection DOAJ
description The uniformity and consistency of X-ray mirror film materials prepared by experimental methods are difficult to guarantee completely. These factors directly affect the service life of free electron laser devices in addition to its own optical properties. Therefore, the quality of the film material, especially the density, has a critical effect on its application. Boron carbide film and monocrystalline silicon substrate were suitable examples to explore their influence of density on the damage threshold based on Monte Carlo and heat-conduction methods. Through simulation results, it was found that the change in film density could affect the energy deposition depth and damage threshold. When the film density was 2.48 g/cm<sup>3</sup>, it had relatively high damage threshold in all energy ranges. And then the specific incident parameter for practical application was investigated. It was found that the damage mechanism of the B<sub>4</sub>C/Si was the melting of the interface. And the damage threshold was also higher with the film density of 2.48 g/cm<sup>3</sup>. Therefore, it was recommended to maintain the density at this value as far as possible when preparing the film, and to ensure the uniformity and consistency of the film material.
first_indexed 2024-04-25T00:25:36Z
format Article
id doaj.art-827fcea468c44685bfeac1d499589d50
institution Directory Open Access Journal
issn 1996-1944
language English
last_indexed 2024-04-25T00:25:36Z
publishDate 2024-02-01
publisher MDPI AG
record_format Article
series Materials
spelling doaj.art-827fcea468c44685bfeac1d499589d502024-03-12T16:48:59ZengMDPI AGMaterials1996-19442024-02-01175102610.3390/ma17051026The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray MirrorTingting Sui0Haohui Zhuo1Anchun Tang2Xin Ju3Department of Physics, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaDepartment of Physics, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaDepartment of Physics, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaDepartment of Physics, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaThe uniformity and consistency of X-ray mirror film materials prepared by experimental methods are difficult to guarantee completely. These factors directly affect the service life of free electron laser devices in addition to its own optical properties. Therefore, the quality of the film material, especially the density, has a critical effect on its application. Boron carbide film and monocrystalline silicon substrate were suitable examples to explore their influence of density on the damage threshold based on Monte Carlo and heat-conduction methods. Through simulation results, it was found that the change in film density could affect the energy deposition depth and damage threshold. When the film density was 2.48 g/cm<sup>3</sup>, it had relatively high damage threshold in all energy ranges. And then the specific incident parameter for practical application was investigated. It was found that the damage mechanism of the B<sub>4</sub>C/Si was the melting of the interface. And the damage threshold was also higher with the film density of 2.48 g/cm<sup>3</sup>. Therefore, it was recommended to maintain the density at this value as far as possible when preparing the film, and to ensure the uniformity and consistency of the film material.https://www.mdpi.com/1996-1944/17/5/1026B<sub>4</sub>C filmdensityXFELMonte Carlodamage threshold
spellingShingle Tingting Sui
Haohui Zhuo
Anchun Tang
Xin Ju
The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
Materials
B<sub>4</sub>C film
density
XFEL
Monte Carlo
damage threshold
title The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
title_full The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
title_fullStr The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
title_full_unstemmed The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
title_short The Influence of B<sub>4</sub>C Film Density on Damage Threshold Based on Monte Carlo Method for X-ray Mirror
title_sort influence of b sub 4 sub c film density on damage threshold based on monte carlo method for x ray mirror
topic B<sub>4</sub>C film
density
XFEL
Monte Carlo
damage threshold
url https://www.mdpi.com/1996-1944/17/5/1026
work_keys_str_mv AT tingtingsui theinfluenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT haohuizhuo theinfluenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT anchuntang theinfluenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT xinju theinfluenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT tingtingsui influenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT haohuizhuo influenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT anchuntang influenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror
AT xinju influenceofbsub4subcfilmdensityondamagethresholdbasedonmontecarlomethodforxraymirror