Periodic Artifacts Generation and Suppression in X-ray Ptychography
As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic...
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| Format: | Article |
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MDPI AG
2023-05-01
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| Series: | Photonics |
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| Online Access: | https://www.mdpi.com/2304-6732/10/5/532 |
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| author | Shilei Liu Zijian Xu Zhenjiang Xing Xiangzhi Zhang Ruoru Li Zeping Qin Yong Wang Renzhong Tai |
| author_facet | Shilei Liu Zijian Xu Zhenjiang Xing Xiangzhi Zhang Ruoru Li Zeping Qin Yong Wang Renzhong Tai |
| author_sort | Shilei Liu |
| collection | DOAJ |
| description | As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography. |
| first_indexed | 2024-03-11T03:23:30Z |
| format | Article |
| id | doaj.art-82a2443a9ebc463b93668a75fc69be42 |
| institution | Directory Open Access Journal |
| issn | 2304-6732 |
| language | English |
| last_indexed | 2024-03-11T03:23:30Z |
| publishDate | 2023-05-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Photonics |
| spelling | doaj.art-82a2443a9ebc463b93668a75fc69be422023-11-18T02:54:06ZengMDPI AGPhotonics2304-67322023-05-0110553210.3390/photonics10050532Periodic Artifacts Generation and Suppression in X-ray PtychographyShilei Liu0Zijian Xu1Zhenjiang Xing2Xiangzhi Zhang3Ruoru Li4Zeping Qin5Yong Wang6Renzhong Tai7Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShenzhen Institute of Advanced Science Facilities, Shenzhen 518107, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaShanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, ChinaAs a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography.https://www.mdpi.com/2304-6732/10/5/532ptychographyperiodic artifactsraster-grid scanperiodic-artifact suppressing algorithmstatic intensity separationprobe support |
| spellingShingle | Shilei Liu Zijian Xu Zhenjiang Xing Xiangzhi Zhang Ruoru Li Zeping Qin Yong Wang Renzhong Tai Periodic Artifacts Generation and Suppression in X-ray Ptychography Photonics ptychography periodic artifacts raster-grid scan periodic-artifact suppressing algorithm static intensity separation probe support |
| title | Periodic Artifacts Generation and Suppression in X-ray Ptychography |
| title_full | Periodic Artifacts Generation and Suppression in X-ray Ptychography |
| title_fullStr | Periodic Artifacts Generation and Suppression in X-ray Ptychography |
| title_full_unstemmed | Periodic Artifacts Generation and Suppression in X-ray Ptychography |
| title_short | Periodic Artifacts Generation and Suppression in X-ray Ptychography |
| title_sort | periodic artifacts generation and suppression in x ray ptychography |
| topic | ptychography periodic artifacts raster-grid scan periodic-artifact suppressing algorithm static intensity separation probe support |
| url | https://www.mdpi.com/2304-6732/10/5/532 |
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