Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations

We report optical and magneto-optical results as well as atomic force microscopy (AFM) and magnetic force microscopy (MFM) results for InFeSb samples prepared by laser ablation. AFM and MFM studies have revealed the presence of magnetic particles on the samples surface, whose sizes depend on the Fe...

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Main Authors: Gan’shina Elena, Golik Leonard, Kun’kova Zoya, Zykov Georgy, Rukovishnikov Alexander, Temiryazeva Marina, Lesnikov Vladimir, Markin Yuri
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:EPJ Web of Conferences
Online Access:https://doi.org/10.1051/epjconf/201818506015
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author Gan’shina Elena
Golik Leonard
Kun’kova Zoya
Zykov Georgy
Rukovishnikov Alexander
Temiryazeva Marina
Lesnikov Vladimir
Markin Yuri
author_facet Gan’shina Elena
Golik Leonard
Kun’kova Zoya
Zykov Georgy
Rukovishnikov Alexander
Temiryazeva Marina
Lesnikov Vladimir
Markin Yuri
author_sort Gan’shina Elena
collection DOAJ
description We report optical and magneto-optical results as well as atomic force microscopy (AFM) and magnetic force microscopy (MFM) results for InFeSb samples prepared by laser ablation. AFM and MFM studies have revealed the presence of magnetic particles on the samples surface, whose sizes depend on the Fe content and substrate temperature. It has found that both optical and magneto-optical spectra are superposition of spectra from the doped InFeSb layers and particles on their surface.
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spelling doaj.art-8310bbd455e6479aae22a2d43f2cf0e92022-12-21T21:25:24ZengEDP SciencesEPJ Web of Conferences2100-014X2018-01-011850601510.1051/epjconf/201818506015epjconf_mism2017_06015Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic InvestigationsGan’shina ElenaGolik LeonardKun’kova ZoyaZykov GeorgyRukovishnikov AlexanderTemiryazeva MarinaLesnikov VladimirMarkin YuriWe report optical and magneto-optical results as well as atomic force microscopy (AFM) and magnetic force microscopy (MFM) results for InFeSb samples prepared by laser ablation. AFM and MFM studies have revealed the presence of magnetic particles on the samples surface, whose sizes depend on the Fe content and substrate temperature. It has found that both optical and magneto-optical spectra are superposition of spectra from the doped InFeSb layers and particles on their surface.https://doi.org/10.1051/epjconf/201818506015
spellingShingle Gan’shina Elena
Golik Leonard
Kun’kova Zoya
Zykov Georgy
Rukovishnikov Alexander
Temiryazeva Marina
Lesnikov Vladimir
Markin Yuri
Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
EPJ Web of Conferences
title Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
title_full Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
title_fullStr Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
title_full_unstemmed Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
title_short Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations
title_sort diluted magnetic semiconductors infesb prepared by laser ablation spectroscopic and microscopic investigations
url https://doi.org/10.1051/epjconf/201818506015
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