Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures
By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...
| Päätekijät: | , , , , , , , |
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| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Julkaistu: |
AIP Publishing LLC
2014-07-01
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| Sarja: | APL Materials |
| Linkit: | http://dx.doi.org/10.1063/1.4890055 |