Identifying the causes of residual stress in polycrystalline diamond compact (PDC) cutters by X-Ray diffraction technique
An attempt was made to identify the sources of residual stress in polycrystalline diamond compact (PDC) cutters by X-ray diffraction (XRD) technique. PDC retains residual stress after sintering and this residual stress plays an important role for cutter performance. X-ray diffraction method of resid...
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| Format: | Article |
| Language: | English |
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Elsevier
2021-09-01
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| Series: | Results in Materials |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2590048X21000492 |